POLARIZATION ENHANCED INTERFEROMETRIC IMAGING
    1.
    发明公开
    POLARIZATION ENHANCED INTERFEROMETRIC IMAGING 审中-公开
    POLARISIERUNGSVERSTÄRKTEINTERFEROMETRISCHE BILDGEBUNG

    公开(公告)号:EP3114429A1

    公开(公告)日:2017-01-11

    申请号:EP15757686.9

    申请日:2015-03-06

    IPC分类号: G01B9/02 G01N21/17 G01N21/45

    摘要: An imaging system uses polarized light to illuminate the target and then uses a polarization filter to remove the light that is reflected from the target without modification. The target can include one or more anisotropic objects that scatter the light and alter the polarization state of the reflected light and causing it to be selectively transmitted to the imaging device which can record the transmitted light through the filter. The illuminating light can be circularly polarized and the filter can remove the circularly polarized light. The target can include asymmetric nanoparticles, such as nanorods that alter the amplitude or phase of the scattered light enabling pass through the filter to be detected by the imaging device.

    摘要翻译: 成像系统使用偏振光照射目标,然后使用偏振滤光器去除从目标反射的光,而无需修改。 目标可以包括散射光并改变反射光的偏振态的一个或多个各向异性物体,并使其被选择性地传输到成像装置,该成像装置可以将透射的光记录通过过滤器。 照明光可以是圆偏振的,并且滤光器可以去除圆偏振光。 靶可以包括不对称纳米颗粒,例如改变散射光的幅度或相位的纳米棒,其能够通过要由成像装置检测的滤光器。