公开(公告)号：EP1482313A4

公开(公告)日：2005-10-12

申请号：EP03703239

申请日：2003-02-06

申请人： YOKOWO SEISAKUSHO KK

发明人： YANAGISAWA WASUKE ,  NAKAKOJI MAKOTO ,  HORIE RYO ,  YOSHIDA TAKUTO

IPC分类号： G01R1/067 ,  G01R31/26

CPC分类号： G01R1/06772 ,  G01R1/06722

摘要： A movable pin (11) having a movable projection length at the front end is disposed and a plurality of probes, such as a signal probe (3) and a power supply probe (4), are disposed to extend through a metal block (1) to allow the front end of the movable pin to project at one surface side of the metal block (1). A test subject device (20) is pressed against one surface side of the metal block (1) to contact the electrode terminals (21-24) of the test subject device with the front ends of the individual probes, thereby testing the test subject device for its characteristics. At least some of these probes are formed around the outer periphery thereof with a dielectric layer and a metal film, thereby providing a capacitor load type probe having a capacitor formed therein. As a result, noise elimination can be reliably effected, and using it as a power supply probe makes it possible to suppress voltage drop across the power supply terminals even if the output varies.

摘要翻译： 由前端的可动突起构成的可动销（11）具有延伸穿过金属块（1）的信号探针（3）和电源探针（4）的多个探针。 在探针的外周形成电介质层和金属膜。 测试夹具还包括独立的权利要求。