公开(公告)号：EP1780517B1

公开(公告)日：2011-12-28

申请号：EP05772334.8

申请日：2005-07-04

申请人： Zubkov, Vladimir Aleksandrovich ,  Zharinov, Konstantin Anatolyevich ,  Shamrai, Aleksandr Valeryevich

发明人： Zubkov, Vladimir Aleksandrovich ,  Zharinov, Konstantin Anatolyevich ,  Shamrai, Aleksandr Valeryevich

IPC分类号： G01D18/00

CPC分类号： G01D18/00

摘要： The invention relates to analytical instrument engineering and can be used for designing calibrating patterns of measuring devices for determining one or several secondary properties of an unknown sample on the basis of the measuring results of a plurality of the primary properties thereof. The inventive method consists in selecting a calibrating set for samples whose secondary properties are known and are defined by means of reference methods, in measuring the primary properties of each said sample by means of a reference device, in converting the measuring results into a form corresponding to the calibratable device, in forming a calibrating pattern enabling to define the analysed secondary properties of the unknown sample on the basis of the measurement of the plurality of primary properties thereof measured by means of the calibratable device. Said method is characterised in that the mathematics for the calibration translations are determined by selecting the combination of samples therefor and the primary properties of each sample are measured by the reference and calibratable devices. The selection of an independent multidimensional calibrating pattern is carried out by comparing the results and by using a method for verifying the accuracy thereof, thereby taking into account the non-linear differences of technical parameters of the calibratable and reference devices and the operating conditions.

公开(公告)号：EP1780517A1

公开(公告)日：2007-05-02

申请号：EP05772334.8

申请日：2005-07-04

申请人： Zubkov, Vladimir Aleksandrovich ,  Zharinov, Konstantin Anatolyevich ,  Shamrai, Aleksandr Valeryevich

发明人： Zubkov, Vladimir Aleksandrovich ,  Zharinov, Konstantin Anatolyevich ,  Shamrai, Aleksandr Valeryevich

IPC分类号： G01D18/00

CPC分类号： G01D18/00

摘要： The invention relates to analytical instrument engineering and can be used for designing calibrating patterns of measuring devices for determining one or several secondary properties of an unknown sample on the basis of the measuring results of a plurality of the primary properties thereof. The inventive method consists in selecting a calibrating set for samples whose secondary properties are known and are defined by means of reference methods, in measuring the primary properties of each said sample by means of a reference device, in converting the measuring results into a form corresponding to the calibratable device, in forming a calibrating pattern enabling to define the analysed secondary properties of the unknown sample on the basis of the measurement of the plurality of primary properties thereof measured by means of the calibratable device. Said method is characterised in that the mathematics for the calibration translations are determined by selecting the combination of samples therefor and the primary properties of each sample are measured by the reference and calibratable devices. The selection of an independent multidimensional calibrating pattern is carried out by comparing the results and by using a method for verifying the accuracy thereof, thereby taking into account the non-linear differences of technical parameters of the calibratable and reference devices and the operating conditions.

摘要翻译： 本发明涉及分析仪器工程，可用于设计用于根据多个主要性能的测量结果确定未知样品的一个或多个二次性质的测量装置的校准模式。 本发明的方法在于选择其二次性质已知并且通过参考方法定义的样品的校准组，在通过参考装置测量每个所述样品的主要性质时，将测量结果转换成对应的形式 以形成校准图案，使得能够基于通过可校准装置测量的多个主要性质的测量来定义未知样品的分析次级特性。 所述方法的特征在于，通过选择其样本的组合来确定校准转换的数学，并且通过参考和可校准装置测量每个样品的主要性质。 通过比较结果和使用验证其精度的方法进行独立多维校准模式的选择，从而考虑到可校准和参考装置的技术参数的非线性差异以及操作条件。

公开(公告)号：EP1707945A1

公开(公告)日：2006-10-04

申请号：EP04808984.1

申请日：2004-11-18

申请人： Zubkov, Vladimir Aleksandrovich ,  Timofeev, Vladimir Andreevich ,  Shamrai, Aleksandr Valeryevich

发明人： Zubkov, Vladimir Aleksandrovich ,  Timofeev, Vladimir Andreevich ,  Shamrai, Aleksandr Valeryevich

IPC分类号： G01N21/85 ,  G01F11/00

CPC分类号： G01N21/85 ,  G01N21/0303 ,  G01N21/05 ,  G01N2021/5919 ,  G01N2021/8557 ,  G01N2021/8592

摘要： The invention relates to analytical instrument engineering, in particular to spectroscopy. The inventive method for measuring spectroscopic properties of bulk products consists in portionwisely supplying a sample in a measurement area. In order to fully fill said measurement area, several portions (at least two) are loaded and alternately placed substantially in different fields of the horizontal section of the measurement area in such a way that the uniformed distribution and the permanent density of the product in the area of measurement are provided. Afterwards, the spectroscopic properties of the sample are recorded in a standstill and the sample is removed from the area of measurement. The inventive device for measuring spectroscopic properties of bulk products comprises a feeding hopper, an input (receiving) opening, a batch loading unit which is provided with means for successively and uniformly distributing the product alternately in the different fields of the horizontal section of the area of measurement, a measuring unit, a unit for closing the area of measurement, an output (unloading) opening and a discharge hopper. Said invention makes it possible to ensure the high uniformity and permanent density of the product in the area of measurement during the measurement of the spectroscopic characteristics of the bulk products.

摘要翻译： 本发明涉及分析仪器工程，尤其是光谱学。 用于测量的散装产品besteht在测量区域portionwisely供给的样品的光谱性质的本发明方法。 为了充分填充所述测定区域，若干个部分（至少两个）被加载，并交替地基本上放置在测量区域的水平部分的不同领域中寻求的方式做了制服的分布和产品在永久密度 提供测量的面积。 此后，样品的光谱性质被记录在静止状态和将样品从测量区移除。 用于测量的散装产品的光谱特性的本发明的装置包括在输入（接收）开口的进料斗中，一批装载单元的所有被用于连续和均匀地区域的水平部分的不同字段可替代地分发产品配备有装置 测量的，测量单元，用于封闭测量区，以输出（卸载）开口和排出料斗的单元。 所述发明使得有可能的散装产品的光谱特性的测量期间确保高的均匀性和在测量区域中的产品的永久密度。