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    MOTION MECHANISM FOR MEASURING PROBE
    1.
    发明公开
    MOTION MECHANISM FOR MEASURING PROBE 审中-实审

    公开(公告)号：EP4379313A1

    公开(公告)日：2024-06-05

    申请号：EP23212597.1

    申请日：2023-11-28

    申请人： Mitutoyo Corporation

    发明人： FREERKSEN, Isaiah

    IPC分类号： G01B5/012 ,  G01B3/00 ,  G01B7/016

    CPC分类号： G01B5/012 ,  G01B3/008 ,  G01B7/016

    摘要： A measuring probe includes a stylus having one or more contact portions; a detection element configured to detect a movement of the stylus based on a contact made by the contact portions; a signal processing portion configured to process a signal from the detection element to output a measurement signal; and a stylus motion mechanism. The stylus motion mechanism includes a first motion portion configured to enable motion of the stylus from a rest position in a positive axial direction when a corresponding force in the positive axial direction is applied by a contact of a contact portion of the stylus with a workpiece; and a second motion portion configured to enable motion of the stylus from the rest position in a negative axial direction opposite to the positive axial direction when a corresponding force is applied by a contact of a contact portion of the stylus with a workpiece.

    EQUIPMENT FOR THE RESET, CALIBRATION AND MEASUREMENT OF MEASURING INSTRUMENTS
    5.
    发明公开
    EQUIPMENT FOR THE RESET, CALIBRATION AND MEASUREMENT OF MEASURING INSTRUMENTS 审中-公开

    公开(公告)号：EP3913321A1

    公开(公告)日：2021-11-24

    申请号：EP21174662.3

    申请日：2021-05-19

    申请人： G.V. Societa' a Responsabilita' Limitata

    发明人： BALBONI, Gabriele

    IPC分类号： G01B5/02 ,  G01B5/08 ,  G01B21/04 ,  G01B3/00

    摘要： The equipment (1) for the reset, calibration and measurement of measuring instruments comprises:
    - one basic frame (2);
    - one pair of measuring stops (3, 4) associated with the basic frame (2), mutually movable and defining between them one measuring seat of one measuring instrument (M), the measuring stops (3, 4) comprising one fixed stop (3) locked together with the basic frame (2) and one movable stop (4) movable in a sliding manner on the basic frame (2) to adjust the width of the measuring seat;
    - manual movement means (5) of the movable stop (4), associated with the basic frame (2) and manually operable;
    - one automatic drive system (6), associable with the manual movement means (5) and adapted to move the movable stop (4) automatically; and
    - removable connecting means (7), adapted to connect/disconnect the automatic drive system (6) to/from the manual movement means (5).

    MESSVORRICHTUNG ZUM MESSEN EINES DURCHMESSERS EINES SEILFÖRMIGEN MESSGUTS
    6.
    发明公开
    MESSVORRICHTUNG ZUM MESSEN EINES DURCHMESSERS EINES SEILFÖRMIGEN MESSGUTS 审中-公开

    公开(公告)号：EP3795939A1

    公开(公告)日：2021-03-24

    申请号：EP19199032.4

    申请日：2019-09-23

    申请人： Teufelberger Fiber Rope GmbH

    发明人： TRAXL, Robert ,  KAISER, Gunter ,  RÜHRNÖßL, Erich ,  ERNST, Björn

    IPC分类号： G01B3/20 ,  G01B5/08 ,  G01B3/00 ,  G01B5/00

    摘要： Die Erfindung betrifft eine Messvorrichtung (1) zum Messen eines Durchmessers eines seilförmigen Messguts (2), umfassend zwei zueinander parallele Messflächen (3, 4), ein Anpressmittel (5), welches dazu ausgebildet ist, die Messflächen (3, 4) bei einem Messvorgang mit einer vorbestimmten Messkraft auf das zwischen den Messflächen (3, 4) befindliche Messgut (2) anzupressen, und eine Messeinheit (6), die dazu ausgebildet ist, einen Abstand der Messflächen (3, 4) zu messen, wobei die Messvorrichtung (1) eine Führungseinrichtung (7) umfasst, welche für den Messvorgang an das Messgut (2) angelegt werden kann, wobei die Führungseinrichtung (7) in Bezug auf die Messflächen (3, 4) derart angeordnet ist, dass das Messgut (2) bei dem Messvorgang eine vordefinierte Position gegenüber den Messflächen (3, 4) einnimmt.

    MAGNETICALLY COUPLED GROUND REFERENCE PROBE
    8.
    发明公开
    MAGNETICALLY COUPLED GROUND REFERENCE PROBE 审中-公开
    磁耦合接地参考探头

    公开(公告)号：EP3321695A1

    公开(公告)日：2018-05-16

    申请号：EP17201201.5

    申请日：2017-11-10

    申请人： Fluke Corporation

    发明人： EPPERSON, David ,  WORONES, Jeffrey ,  RODRIGUEZ, Ricardo

    IPC分类号： G01R1/067 ,  G01B3/00

    CPC分类号： G01R15/125 ,  G01B3/008 ,  G01R1/06705

    摘要： Systems and methods of providing a magnetically coupled ground reference probe for use with test equipment (e.g., digital multimeters (DMMs)). The magnetically coupled ground reference probes disclosed herein may be used instead of a typical test probe or alligator clip. A magnetically coupled ground reference probe may be provided which includes an insulative housing surrounding a conductive magnet (e.g., permanent magnet, electromagnet). The magnet may autonomously retract into a cavity of the insulative housing when not coupled to a ground reference so that the magnet does not contact a high potential source when being handled by the operator. In at least some implementations, at least a portion of the insulation material of the housing may be compressible to allow the magnet to come into physical contact with a ground reference surface while providing a sufficient creepage and clearance path.

    摘要翻译： 提供用于测试设备（例如数字万用表（DMM））的磁耦合接地参考探头的系统和方法。 这里公开的磁耦合接地参考探头可以用来代替典型的测试探头或鳄鱼夹。 可以提供磁耦合接地参考探针，其包括围绕导电磁体（例如，永磁体，电磁体）的绝缘壳体。 当不连接到地参考时，磁体可以自主地缩回到绝缘壳体的空腔中，使得磁体在被操作员处理时不接触高电位源。 在至少一些实施方式中，壳体的绝缘材料的至少一部分可以是可压缩的，以允许磁体与接地参考表面进行物理接触，同时提供足够的漏电和间隙路径。