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227 条记录 (耗时 0.017 秒)

    QCM APPARATUS
    8.
    发明公开
    QCM APPARATUS 审中-公开

    公开(公告)号：EP4191241A1

    公开(公告)日：2023-06-07

    申请号：EP21212365.7

    申请日：2021-12-03

    申请人： Biolin Scientific AB

    发明人： SVENSSON, Peter

    IPC分类号： G01N29/22 ,  G01N29/32

    摘要： A QCM sensor apparatus comprising a sensor holder (2) having a compartment for receiving a QCM sensor, the compartment having a substantially planar extension, a first temperature sensor (14a) and a second temperature sensor (14b) arranged separated from each other along a line transverse to the planar extension; and a controller (13) configured to determine a temperature difference, ΔT, between the two sensors, and operating the QCM apparatus based on this temperature difference.
    By determining and monitoring not only the temperature in the measurement cell, but also the temperature difference ΔT, the controller may therefore improve measurement performance.

    SUPPORT BED FOR IMPACT MEASUREMENTS
    9.
    发明公开
    SUPPORT BED FOR IMPACT MEASUREMENTS 审中-公开

    公开(公告)号：EP4170338A1

    公开(公告)日：2023-04-26

    申请号：EP21204598.3

    申请日：2021-10-25

    申请人： GrindoSonic BV

    发明人： VAN DEN BOSSCHE, Alex

    IPC分类号： G01N29/04 ,  G01N29/12 ,  G01N29/22 ,  G01N29/32 ,  G01N29/46

    摘要： The present invention relates to an impact excitation measurement system comprising a temperature controlled testing chamber, an impactor, a sensor system and a support system, wherein the impactor is configured to, at any testing temperature within a testing temperature range of between 0°C and 1600°C, provide an impact from below to a test piece supported by the support system, wherein the sensor system is configured to obtain a vibrational response of the test piece to the impact provided to the test piece by the impactor, wherein the support system comprises a bedding for supporting a solid test piece within the testing chamber, said bedding comprising an elasticity which is substantially larger than the elasticity of the test piece, said bedding further comprising a through for allowing the impactor to provide an impact to the test piece from below, wherein the impactor is configured to provide the impact to the test piece at an impact height which impact height is at least partially dependent upon the testing temperature, wherein the bedding is configured to support the test piece at a support height which differs from the impact height for at most 0.5 mm at any testing temperature within said testing temperature range.