SCANNING INSPECTION DEVICE
    1.
    发明公开

    公开(公告)号:EP4459334A1

    公开(公告)日:2024-11-06

    申请号:EP22914868.9

    申请日:2022-12-28

    IPC分类号: G01V5/00 G01N23/046 A61B6/03

    摘要: The present disclosure relates to a scanning inspection device, comprises a first rotating frame (1), a first drive device, a ray source (2), a detector (3), a cooling device for cooling the ray source (2), and a second drive device, wherein the center of the first rotating frame (1) is provided with a conveying channel for passage of an object to be inspected (6); the first drive device in drive connection with the first rotating frame (1) to drive the first rotating frame (1) to rotate, wherein the ray source (2), the detector (3), and the cooling device for cooling the ray source (2) are each mounted on the first rotating frame (1) and rotate with the first rotating frame (1); and a second drive device configured to drive the cooling device to rotate toward a direction opposite to a rotation direction of the first rotating frame (1), so that the cooling device is maintained in a fixed attitude during rotation with the first rotating frame

    MULTI-RAY SOURCE INSPECTION DEVICE AND INSPECTION METHOD

    公开(公告)号:EP4459332A1

    公开(公告)日:2024-11-06

    申请号:EP22914540.4

    申请日:2022-12-23

    IPC分类号: G01V5/00 G01N23/04

    摘要: Provided is a multi-ray source inspection apparatus, including: a first inspection device (10) configured to acquire a two-dimensional first transmission image of an inspected object and a second inspection device (20) configured to acquire a second transmission image of the inspected object including three-dimensional information. A first radiation beam and a second radiation beam are emitted in a time-sharing manner, and the two-dimensional first transmission image and the second transmission image including the three-dimensional information are respectively acquired after the inspected object passes an inspection channel once. An inspection method using multiple ray sources is further provided.