CT INSPECTION SYSTEM AND CT IMAGING METHOD
    1.
    发明公开

    公开(公告)号:EP3505977A1

    公开(公告)日:2019-07-03

    申请号:EP19150074.3

    申请日:2019-01-02

    Abstract: The present disclosure relates to the technical field of CT detection, and in particular to a CT inspection system and a CT imaging method. The CT inspection system provided by the present disclosure comprises a radioactive source device, a detection device, a rotation monitoring device and an imaging device, wherein the detection device obtains detection data at a frequency that is N times a beam emitting frequency of the radioactive source device; the rotation monitoring device detects a rotation angle of the detection device and transmits a signal to the imaging device each time the detection device rotates by a preset angle; the imaging device determines a rotational position of the detection device each time the radioactive source device emits a beam according to the signal transmitted by the rotation monitoring device and the detection data of the detection device, and generates a CT image based on the detection data and the rotational position of the detection device each time the radioactive source device emits a beam. The present disclosure can accurately determine the rotational position of the detection device each time the radioactive source device emits a beam, so that it is possible to effectively reduce the image deformation and improve the accuracy of detection results.

    MULTI-RAY SOURCE INSPECTION DEVICE AND INSPECTION METHOD

    公开(公告)号:EP4459332A1

    公开(公告)日:2024-11-06

    申请号:EP22914540.4

    申请日:2022-12-23

    Abstract: Provided is a multi-ray source inspection apparatus, including: a first inspection device (10) configured to acquire a two-dimensional first transmission image of an inspected object and a second inspection device (20) configured to acquire a second transmission image of the inspected object including three-dimensional information. A first radiation beam and a second radiation beam are emitted in a time-sharing manner, and the two-dimensional first transmission image and the second transmission image including the three-dimensional information are respectively acquired after the inspected object passes an inspection channel once. An inspection method using multiple ray sources is further provided.

    CT INSPECTION SYSTEM AND CT IMAGING METHOD
    3.
    发明公开

    公开(公告)号:EP3505978A1

    公开(公告)日:2019-07-03

    申请号:EP19150075.0

    申请日:2019-01-02

    Abstract: The present disclosure relates to the technical field of CT detection, in particular to a CT inspection system and a CT imaging method. The CT inspection system provided by the present disclosure includes a scanning device and an imaging device, wherein the scanning device having a radioactive source device and a detection device is configured to rotate at a non-uniform speed in at least partial process of scanning an object to be detected; and the imaging device generates a CT image based on effective detection data, wherein the effective detection data refer to data acquired each time the detection device rotates by a preset angle. In the present disclosure, the imaging device of the CT inspection system generates a CT image based on data acquired each time the detection device rotates by a preset angle, which, compared with traditional image collection solutions, can effectively reduce image deformation and improve accuracy of detection results.

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