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公开(公告)号:EP2878963B1
公开(公告)日:2022-11-23
申请号:EP13194784.8
申请日:2013-11-28
发明人: Eybel, Oliver , Zalto, Roland
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公开(公告)号:EP3206042B1
公开(公告)日:2022-08-31
申请号:EP15848783.5
申请日:2015-07-29
IPC分类号: G01R31/327 , G01R27/20 , G01R31/00 , G01R27/14
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公开(公告)号:EP1723436B1
公开(公告)日:2020-11-25
申请号:EP04769036.7
申请日:2004-10-27
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公开(公告)号:EP3012644B1
公开(公告)日:2020-08-05
申请号:EP14835375.8
申请日:2014-08-06
申请人: LG Chem, Ltd.
发明人: BOBER, Greg
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公开(公告)号:EP3489707B1
公开(公告)日:2020-07-15
申请号:EP18208895.5
申请日:2018-11-28
申请人: Fluke Corporation
发明人: STEUER, Ronald
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公开(公告)号:EP3546957A1
公开(公告)日:2019-10-02
申请号:EP18164703.3
申请日:2018-03-28
发明人: SZUMANSKI, Thomas
摘要: A system for monitoring electrical current leakage comprises a frequency injection circuit, one or more devices, and a microprocessor. The frequency injection circuit (245) includes an electronic oscillator (205) providing an electrical signal to a first side of an isolation barrier. The devices are located on a second side of the isolation barrier. The microprocessor (240) samples the electrical signal and identifies deviations in the sampled electrical signal exceeding a predetermined threshold caused by the one or more devices. The microprocessor further generates one or more alert messages based on the identified deviations in the electrical signal.
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公开(公告)号:EP3004901B1
公开(公告)日:2019-07-03
申请号:EP14734206.7
申请日:2014-05-30
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公开(公告)号:EP3494375A2
公开(公告)日:2019-06-12
申请号:EP17772611.4
申请日:2017-08-03
申请人: Pilz GmbH & Co. KG
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公开(公告)号:EP3489707A1
公开(公告)日:2019-05-29
申请号:EP18208895.5
申请日:2018-11-28
申请人: Fluke Corporation
发明人: STEUER, Ronald
摘要: Systems and methods provide measurement of one or more electrical parameters ( e.g ., impedance) of a device under test (DUT) using an electrical parameter measurement device ( e.g ., multimeter, oscilloscope) that includes reference signal circuitry that generates, detects, and processes common mode reference signals. A measurement device may include a known common mode AC reference voltage source coupled to a common input terminal. During measurement of a DUT, circuitry may detect a signal at a voltage test input terminal and a signal at the common input terminal. The circuitry may process the first and second signals to determine one or more electrical parameters of the DUT, which one or more electrical parameters may be used to implement one or more features. The determined electrical parameters may be presented to an operator via a visual indicator device and/or may be communicated to an external device via a wired and/or wireless communications interface.
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