公开(公告)号：JP4467431B2

公开(公告)日：2010-05-26

申请号：JP2004523923

申请日：2003-07-21

Applicant: エドワーズ リミテッド

Inventor： シアマック アッバスザデ ,  デレク サヴィッジ ,  ナイジェル ポール ショフィールド

IPC: F04B51/00 ,  F04D15/00

CPC classification number: F04B51/00 ,  F04D19/04 ,  F04D27/001 ,  F05D2260/607

Abstract: A method of monitoring the condition of a pump (10) or at least one component of a system that includes a pump which component or components are not a part of the pump, includes the step of generating a predetermined test condition in the pump or system component or components. During a period in which such a test condition is present, signals indicative of the pump or system component or components are obtained. Wear in the pump bearings, the build-up of deposits in the pump or in pipework forming a part of the pump system can be detected or predicted and corrective action taken before the pump or system fails. By providing a method of monitoring pump or system condition in-situ, it is possible to reduce the likelihood of pump failure in use and the need to carry out over frequent servicing of the pump.