公开(公告)号：US20080025595A1

公开(公告)日：2008-01-31

申请号：US11767483

申请日：2007-06-23

Applicant: Chung-Hwa Chang ,  Hsin-Ching Su

Inventor： Chung-Hwa Chang ,  Hsin-Ching Su

IPC: G06K9/00 ,  G06F19/00

CPC classification number: G06T7/001 ,  G06T2207/30141

Abstract: A method for automatically inspecting positive and negative polar directions of a polar element on a substrate is provided. Firstly, an image of a standard substrate is retrieved to form a standard sample, and relevant data of the polar elements on a substrate to be inspected is obtained to form the inspected sample. Then, transforming the geometry coordinates to the pixel coordinates, using different shapes of frames to make each polar element be positioned within, and marking the positions, positive and negative polar directions of all the polar elements in the image of the standard substrate. A database is set up to record the relevant data of each polar element as the standard sample for inspecting. The standard sample is compared with all the samples to be inspected to inspect whether the polar directions of each polar element is correct or not.

Abstract translation: 提供一种用于自动检查基板上的极性元件的正极性和负极性方向的方法。 首先，检索标准基板的图像以形成标准样品，并且获得要检查的基板上的极性元件的相关数据，以形成检查样品。 然后，使用不同形状的框架将几何坐标转换为像素坐标，以使每个极性元件位于标准衬底的图像中的所有极性元件的正极性方向和负极极方向上，并且标记位置。 设置数据库以记录每个极性元素的相关数据作为检查的标准样品。 将标准样品与待检查的所有样品进行比较，以检查每个极性元件的极性方向是否正确。

公开(公告)号：US07957578B2

公开(公告)日：2011-06-07

申请号：US11767483

申请日：2007-06-23

Applicant: Chung-Hwa Chang ,  Hsin-Ching Su

Inventor： Chung-Hwa Chang ,  Hsin-Ching Su

IPC: G06K9/00

CPC classification number: G06T7/001 ,  G06T2207/30141

Abstract: A method for automatically inspecting positive and negative polar directions of a polar element on a substrate is provided. Firstly, an image of a standard substrate is retrieved to form a standard sample, and relevant data of the polar elements on a substrate to be inspected is obtained to form the inspected sample. Then, transforming the geometry coordinates to the pixel coordinates, using different shapes of frames to make each polar element be positioned within, and marking the positions, positive and negative polar directions of all the polar elements in the image of the standard substrate. A database is set up to record the relevant data of each polar element as the standard sample for inspecting. The standard sample is compared with all the samples to be inspected to inspect whether the polar directions of each polar element is correct or not.

Abstract translation: 提供一种用于自动检查基板上的极性元件的正极性和负极性方向的方法。 首先，检索标准基板的图像以形成标准样品，并且获得要检查的基板上的极性元件的相关数据，以形成检查样品。 然后，使用不同形状的框架将几何坐标转换为像素坐标，以使每个极性元件位于标准衬底的图像中的所有极性元件的正极性方向和负极极方向上，并且标记位置。 设置数据库以记录每个极性元素的相关数据作为检查的标准样品。 将标准样品与待检查的所有样品进行比较，以检查每个极性元件的极性方向是否正确。

公开(公告)号：US20090296082A1

公开(公告)日：2009-12-03

申请号：US12386644

申请日：2009-04-21

Applicant: Hsin-Ching Su ,  Chung-Hwa Chang

Inventor： Hsin-Ching Su ,  Chung-Hwa Chang

IPC: G01N21/88 ,  G06F19/00

CPC classification number: G01N21/95607 ,  G01N2021/8845 ,  G01N2021/95638 ,  G06T7/001 ,  G06T2207/30141

Abstract: A circuit board detecting device and a detecting method are provided. The circuit board detecting device includes an image capture apparatus and a main unit. The image capture apparatus is coupled to the main unit to capture images of the surfaces of a sample circuit board and a test circuit board. In addition, the main unit is used to receive a sample frame and a test frame and compare the images of every object on the sample frame with the images of every object on the test frame to confirm if the test circuit board has flaws on the surface.

Abstract translation: 提供电路板检测装置和检测方法。 电路板检测装置包括图像捕获装置和主单元。 图像捕获装置耦合到主单元以捕获采样电路板和测试电路板的表面的图像。 此外，主单元用于接收样品框架和测试框架，并将样品框架上每个物体的图像与测试框架上每个物体的图像进行比较，以确认测试电路板是否在表面有缺陷 。

公开(公告)号：US20090022406A1

公开(公告)日：2009-01-22

申请号：US12219282

申请日：2008-07-18

Applicant: Chung-Hwa Chang ,  Hsin-Ching Su

Inventor： Chung-Hwa Chang ,  Hsin-Ching Su

IPC: G06K9/68

CPC classification number: G06K9/3216 ,  G06T7/66 ,  G06T7/74 ,  G06T2207/30141

Abstract: A method for finding a specific pattern is used to find a specific pattern in an image to be tested. The method comprises the following steps of: acquiring an image to be tested; performing a binary thresholding process on the image to be tested, thereby transforming the image to be tested into a binary image; performing a mosaic process on the binary image, thereby transforming the binary image into a mosaic image; utilizing a correlation coefficient method to find the specific pattern most similar to an image template from the mosaic image, wherein the image template is a desired mosaic pattern of the specific pattern; and transforming the mosaic image back into the binary image so as to find the coordinate of the specific pattern accurately.

Abstract translation: 用于找到特定图案的方法用于在要测试的图像中找到特定图案。 该方法包括以下步骤：获取要测试的图像; 对要测试的图像执行二进制阈值处理，从而将要测试的图像变换为二进制图像; 对二进制图像执行马赛克处理，从而将二进制图像变换成马赛克图像; 利用相关系数法从马赛克图像中找出与图像模板最相似的特定图案，其中图像模板是特定图案的所需马赛克图案; 并将马赛克图像转换回二进制图像，以便精确地找到特定图案的坐标。