摘要:
The invention provides an SPR measuring method and a measuring system thereof. According to the measuring method, first, a linear-polarized coherent broadband pulsed light beam is incident onto a surface of a sample under detection of a SPR sensing device to cause reflection; next, a time-domain monotonous chirp is performed on the incident coherent broadband pulsed light and/or the SPR reflected light; finally, the time-domain monotonically chirped SPR reflected light beam is detected, and information of the SPR effect is obtained according to the detected signal. According to the invention, the spectrum detection method used in conventional slow wavelength interrogation is converted into the high-speed real-time detection of time-domain pulse shape signals. Thus, the procedure of the SPR reaction may be monitored closely, and dynamical curves with very high time resolution may be obtained, in that case, fast biochemical reaction procedures may be monitored. As each part of the measuring system may remain fixed during the measurement, a compact, miniature and portable system may be realized. The interrogation part of the sensing system is easy-to-realize, of low cost and compatible with various SPR devices and components.
摘要:
The present disclosure provides a detection system for acquiring the SPR angle, including a modulatable SPR sensor to be detected; an incident light source apparatus; a photoelectric detector; a narrowband filter system; a modulated signal source for generating an alternating current signal that is used to modulate said modulatable SPR sensor; and a data processing system for recording the corresponding relationship between the incident angle and the intensity of the filtered reflected light and further obtaining the resonance angle of said modulatable SPR sensor. The present disclosure also provides a corresponding detection method for acquiring the SPR angle.
摘要:
The invention provides an SPR measuring method and a measuring system thereof. According to the measuring method, first, a linear-polarized coherent broadband pulsed light beam is incident onto a surface of a sample under detection of a SPR sensing device to cause reflection; next, a time-domain monotonous chirp is performed on the incident coherent broadband pulsed light and/or the SPR reflected light; finally, the time-domain monotonically chirped SPR reflected light beam is detected, and information of the SPR effect is obtained according to the detected signal. According to the invention, the spectrum detection method used in conventional slow wavelength interrogation is converted into the high-speed real-time detection of time-domain pulse shape signals. Thus, the procedure of the SPR reaction may be monitored closely, and dynamical curves with very high time resolution may be obtained, in that case, fast biochemical reaction procedures may be monitored. As each part of the measuring system may remain fixed during the measurement, a compact, miniature and portable system may be realized. The interrogation part of the sensing system is easy-to-realize, of low cost and compatible with various SPR devices and components.
摘要:
The present disclosure provides a detection system for acquiring the SPR angle, including a modulatable SPR sensor to be detected; an incident light source apparatus; a photoelectric detector; a narrowband filter system; a modulated signal source for generating an alternating current signal that is used to modulate said modulatable SPR sensor; and a data processing system for recording the corresponding relationship between the incident angle and the intensity of the filtered reflected light and further obtaining the resonance angle of said modulatable SPR sensor. The present disclosure also provides a corresponding detection method for acquiring the SPR angle.
摘要:
A sensor chip based on the WCSPR effect and an array thereof are disclosed. The sensor chip is a multilayer structure comprising a substrate, a dielectric waveguide layer (26) disposed on the substrate and a first metal layer (27) disposed on the dielectric waveguide layer (26), wherein parameters of physical properties of the dielectric waveguide layer (26) are tunable.