公开(公告)号：US5473261A

公开(公告)日：1995-12-05

申请号：US255917

申请日：1994-06-07

申请人： Hideji Marumoto ,  Nobuyuki Kawase ,  Masasi Hosomi ,  Katsumi Irie ,  Koji Fukuda ,  Yuichiro Mochizuki

发明人： Hideji Marumoto ,  Nobuyuki Kawase ,  Masasi Hosomi ,  Katsumi Irie ,  Koji Fukuda ,  Yuichiro Mochizuki

IPC分类号： G02F1/13 ,  G02F1/1343 ,  G02F1/1345 ,  G06F11/267 ,  G09G3/00 ,  G01R31/00

CPC分类号： G09G3/006 ,  G06F11/2221

摘要： The inspection apparatus of the invention inspects a display device including first and second bus lines formed on an active matrix substrate. The inspection apparatus includes a first substrate unit and a second substrate unit each having a pair of substrates and connecting films therebetween. On one substrate of each substrate unit, inspection terminals and first inspection lines are formed and each of the inspection lines are connected to one of the inspection terminals. On the other substrate of each substrate unit, second inspection lines are provided. The first and second inspection lines of the substrates are selectively connected by the connecting films. During inspection, the second inspection lines of the first substrate unit are brought directly in contact with the first bus lines, so that each of the first bus lines is connected to one of the inspection terminals of the first substrate unit. Each of the second bus lines is connected to one of the inspection terminals of the second substrate unit via the respective second inspection lines in the same way. The apparatus further includes: a driving signal input circuit for supplying driving signals for a display inspection of the display device to the inspection terminals of each substrate unit; a resistance measuring device for measuring resistances of the first and second bus lines of the display device; and a section for connecting either of the driving signal input circuit or the resistance measuring device to the first and second substrate unit.

摘要翻译： 本发明的检查装置检查包括形成在有源矩阵基板上的第一和第二总线的显示装置。 检查装置包括第一基板单元和第二基板单元，每个基板单元和第二基板单元各自具有一对基板和其间的连接膜。 在每个基板单元的一个基板上，形成检查端子和第一检查线，并且将每条检查线连接到检查端子之一。 在每个基板单元的另一基板上设置第二检查线。 基板的第一和第二检查线由连接膜选择性地连接。 在检查中，第一基板单元的第二检查线直接与第一总线接触，使得第一总线中的每一条连接到第一基板单元的检查端子之一。 各个第二总线通过相应的第二检查线连接到第二基板单元的检查端子之一。 该装置还包括：驱动信号输入电路，用于将显示装置的显示检查的驱动信号提供给每个基板单元的检查端; 电阻测量装置，用于测量显示装置的第一和第二总线的电阻; 以及用于将驱动信号输入电路或电阻测量装置中的任一个连接到第一和第二基板单元的部分。