Structure and method of formation of body contacts in SOI MOSFETS to
elimate floating body effects
    1.
    发明授权
    Structure and method of formation of body contacts in SOI MOSFETS to elimate floating body effects 有权
    SOI MOSFET中体接触形成的结构和方法,以浮现浮体效应

    公开(公告)号:US5965917A

    公开(公告)日:1999-10-12

    申请号:US225248

    申请日:1999-01-04

    摘要: A silicon-on-insulator MOSFET includes a silicon layer and an insulator layer positioned over a silicon substrate. An isolation region defines a silicon region positioned over the insulator layer. The silicon region further includes a source region, a drain region, and a doped body region. The drain region and source region do not extend to the bottom of the silicon region. A first metal conductor is electrically coupled to the side and top of the source region and the side of the body region. The first metal conductor establishes a potential at the body region to control floating body effects. A second metal conductor is electrically coupled to the top of the drain region.

    摘要翻译: 绝缘体上硅MOSFET包括硅层和位于硅衬底上的绝缘体层。 隔离区域限定位于绝缘体层上方的硅区域。 硅区还包括源极区,漏极区和掺杂体区。 漏极区域和源极区域不延伸到硅区域的底部。 第一金属导体电耦合到源区域和身体区域的侧面的侧面和顶部。 第一金属导体在身体区域建立一个潜力来控制浮体效应。 第二金属导体电耦合到漏区的顶部。