UNDERWATER OPTICAL METROLOGY SYSTEM
    3.
    发明申请

    公开(公告)号:US20190011552A1

    公开(公告)日:2019-01-10

    申请号:US16031867

    申请日:2018-07-10

    申请人: 3D at Depth, Inc.

    IPC分类号: G01S15/87 G01S17/88

    摘要: Described herein are methods and devices for improved location of any and all underwater structures or equipment installed underwater. In particular, systems are disclosed that combine optical and acoustic metrology for locating objects in underwater environments. The systems allow for relative positions of objects to be determined with great accuracy using optical techniques, and support enhanced location of devices that utilize acoustic location techniques. In addition, location information can be provided by the system even in conditions that make optical metrology techniques impossible or impractical.