公开(公告)号：US20240027525A1

公开(公告)日：2024-01-25

申请号：US18364568

申请日：2023-08-03

Applicant: ADVANCED MICRO DEVICES, INC.

Inventor： AHMET TOKUZ ,  SAURABH B. UPADHYAY

IPC: G01R31/3185 ,  G01R31/3177 ,  G06F11/22

CPC classification number: G01R31/318583 ,  G01R31/3177 ,  G01R31/318572 ,  G06F11/2236

Abstract: A system for performing a scan test of a processor core includes a scan test module and a processor including a processor core and an input/output die, where the input/output die is coupled to the processor core. The scan test module transmits, in parallel to the input/output die, scan test input data. A serializer/deserializer module of the input/output die receives the input data, serializes the input data, and transmits the serialized input data to the processor core. A serializer/deserializer module of the processor core receives the serialized scan test input data, deserializes the input data, receives result data generated in dependence upon the input data, serializes the result data, and transmits the serialized result data to the input/output die. The input/output die serializer/deserializer module receives the result data, deserializes the result data, and provides the result data to the scan test module. Error detection can be carried out through redundancy.