公开(公告)号：US20230319610A1

公开(公告)日：2023-10-05

申请号：US18163933

申请日：2023-02-03

Applicant: ANRITSU CORPORATION

Inventor： Takahiro KASAGI ,  Koichi INOUE ,  Hiroyuki TANIKAGE

IPC: H04W24/08 ,  H04W80/04

CPC classification number: H04W24/08 ,  H04W80/04

Abstract: A measurement device includes: a display unit that displays information related to a test; a device control unit group that includes a plurality of device control units controlling control target devices of a control target device group, respectively, the control target device group including the control target devices that each simulate the component of the component group, respectively; a measurement target setting unit that sets a component selected from the component group as a measurement target device; a test case creation unit that creates a test case by displaying a use order of device control units to be used for the test of the measurement target device among the device control unit group on the display unit in a user-settable manner; and a test case execution unit that executes the test case as to the device control units to be used for the test in the set use order.