公开(公告)号：US20230319610A1

公开(公告)日：2023-10-05

申请号：US18163933

申请日：2023-02-03

Applicant: ANRITSU CORPORATION

Inventor： Takahiro KASAGI ,  Koichi INOUE ,  Hiroyuki TANIKAGE

IPC: H04W24/08 ,  H04W80/04

CPC classification number: H04W24/08 ,  H04W80/04

Abstract: A measurement device includes: a display unit that displays information related to a test; a device control unit group that includes a plurality of device control units controlling control target devices of a control target device group, respectively, the control target device group including the control target devices that each simulate the component of the component group, respectively; a measurement target setting unit that sets a component selected from the component group as a measurement target device; a test case creation unit that creates a test case by displaying a use order of device control units to be used for the test of the measurement target device among the device control unit group on the display unit in a user-settable manner; and a test case execution unit that executes the test case as to the device control units to be used for the test in the set use order.

公开(公告)号：US20250048290A1

公开(公告)日：2025-02-06

申请号：US18783607

申请日：2024-07-25

Applicant: ANRITSU CORPORATION

Inventor： Koji FUKAZAWA ,  Hiroyuki TANIKAGE

IPC: H04W56/00 ,  H04J3/06 ,  H04W24/06

Abstract: There are provided an Ethernet unit that performs transmission and reception of a packet with an O-RU, a time generation unit that generates a base time of a measurement device, a transmission time error insertion unit that inserts an error in a time generated by the time generation unit in a case of inserting a PTP error, and a reception time error insertion unit that inserts an error in a time which is notified by the Ethernet unit in a case of inserting a PTP error, in which the transmission time error insertion unit and the reception time error insertion unit add an error amount while gradually increasing the error amount to an offset value in a case where an offset-attached error addition test is performed, and perform the error addition test in a case where the error amount reaches the offset value.

公开(公告)号：US20250047404A1

公开(公告)日：2025-02-06

申请号：US18783577

申请日：2024-07-25

Applicant: ANRITSU CORPORATION

Inventor： Koji FUKAZAWA ,  Hiroyuki TANIKAGE

IPC: H04J3/06 ,  H04W24/06 ,  H04W56/00

Abstract: A measurement system is capable of improving the accuracy of a time at a low cost with a simple configuration. A measurement device has a 1PPS signal input unit that receives a 1PPS signal generated by an external signal generation device to output to a PTP time control unit, and a PTP time control unit that performs PTP time control by referring to the 1PPS signal, and a control PC which transmits processing delay prospect information to the PTP time control unit together with time information acquired from an NTP server by an operation performed on an operation unit by a user, in which the PTP time control unit corrects the time information received from the control PC while including the processing delay prospect information by referring to the 1PPS signal, and uses the corrected time information as time information of the PTP.