公开(公告)号：US20140167794A1

公开(公告)日：2014-06-19

申请号：US13715648

申请日：2012-12-14

Applicant: APPLE INC.

Inventor： Jayesh Nath ,  Liang Han ,  Matthew A. Mow ,  Ming-Ju Tsai ,  Joshua G. Nickel ,  Hao Xu ,  Peter Bevelacqua ,  Mattia Pascolini ,  Robert W. Schiub ,  Ruben Caballero

IPC: G01R35/00

CPC classification number: G01R35/007 ,  G01R31/2822 ,  G01R31/2879 ,  G01R31/3191

Abstract: A manufacturing system for assembling wireless electronic devices is provided. The manufacturing system may include test stations for testing the radio-frequency performance of components that are to be assembled within the electronic devices. A reference test station may be calibrated using calibration coupons having known radio-frequency characteristics. The calibration coupons may include transmission line structures. The reference test station may measure verification standards to establish baseline measurement data. The verification standards may include circuitry having electrical components with given impedance values. Many verification coupons may be measured to enable testing for a wide range of impedance values. Test stations in the manufacturing system may subsequently measure the verification standards to generate test measurement data. The test measurement data may be compared to the baseline measurement data to characterize the performance of the test stations to ensure consistent test measurements across the test stations.

Abstract translation: 提供了一种用于组装无线电子设备的制造系统。 制造系统可以包括用于测试要在电子设备内组装的组件的射频性能的测试站。 可以使用具有已知射频特性的校准试样来校准参考测试台。 校准试样可以包括传输线结构。 参考测试站可以测量验证标准以建立基线测量数据。 验证标准可以包括具有给定阻抗值的电气部件的电路。 可以测量许多验证券，以测试宽范围的阻抗值。 制造系统中的测试台随后可以测量验证标准以产生测试测量数据。 可以将测试测量数据与基线测量数据进行比较，以表征测试站的性能，以确保跨越测试站的一致的测试测量。