公开(公告)号：US09372228B2

公开(公告)日：2016-06-21

申请号：US14500418

申请日：2014-09-29

Applicant: Apple Inc.

Inventor： Joshua G. Nickel ,  Jonathan P. G. Gavin

IPC: G01R31/302 ,  G01R31/265

CPC classification number: G01R31/3025 ,  G01R31/265

Abstract: Electronic device structures such as structures containing antennas, connectors, welds, electronic device components, conductive housing structures, and other structures can be tested for faults using a non-contact test system. The test system may include a vector network analyzer or other test unit that generates radio-frequency tests signals in a range of frequencies. The radio-frequency test signals may be transmitted to electronic device structures under test using an antenna probe that has one or more test antennas. The antenna probe may receive corresponding radio-frequency signals. The transmitted and received radio-frequency test signals may be analyzed to determine whether the electronic device structures under test contain a fault.

Abstract translation: 可以使用非接触测试系统来测试诸如包含天线，连接器，焊缝，电子器件部件，导电壳体结构和其它结构的结构的电子器件结构。 测试系统可以包括矢量网络分析器或其它测试单元，其产生频率范围内的射频测试信号。 射频测试信号可以使用具有一个或多个测试天线的天线探针发射到被测电子设备结构。 天线探头可以接收相应的射频信号。 可以分析发送和接收的射频测试信号以确定被测电子设备结构是否包含故障。

公开(公告)号：US09154972B2

公开(公告)日：2015-10-06

申请号：US13916090

申请日：2013-06-12

Applicant: Apple Inc.

Inventor： Jerzy Guterman ,  Joshua G. Nickel ,  Boon W. Shiu ,  Mattia Pascolini

IPC: H04W24/00

CPC classification number: H04W24/00 ,  H04W24/06

Abstract: A wireless electronic device may be provided with antenna structures. The antenna structures may be formed from an antenna ground and an array of antenna resonating elements formed along its periphery. The antenna resonating elements may be formed from metal traces on a dielectric support structure that surrounds the antenna ground. The electronic device may be tested using a test system for detecting the presence of manufacturing/assembly defects. The test system may include an RF tester and a test fixture. The device under test (DUT) may be attached to the test fixture during testing. Multiple test probes arranged along the periphery of the DUT may be used to transmit and receive RF test signals for gathering scattering parameter measurements on the device under test. The scattering parameter measurements may then be compared to predetermined threshold values to determine whether the DUT contains any defects.

Abstract translation: 无线电子设备可以设置有天线结构。 天线结构可以由天线接地和沿其周边形成的天线谐振元件的阵列形成。 天线谐振元件可以由围绕天线接地的电介质支撑结构上的金属迹线形成。 可以使用用于检测制造/组装缺陷的存在的测试系统来测试电子设备。 测试系统可以包括RF测试器和测试夹具。 被测设备（DUT）可以在测试期间连接到测试夹具。 沿着DUT周边布置的多个测试探头可用于发送和接收RF测试信号，用于在被测器件上采集散射参数测量。 然后可以将散射参数测量与预定阈值进行比较，以确定DUT是否包含任何缺陷。

公开(公告)号：US08995926B2

公开(公告)日：2015-03-31

申请号：US13629414

申请日：2012-09-27

Applicant: Apple Inc.

Inventor： Matthew A. Mow ,  Thomas E. Biedka ,  Ming-Ju Tsai ,  Liang Han ,  Xu Han ,  Anand Lakshmanan ,  Nanbo Jin ,  Hongfei Hu ,  Dean F. Darnell ,  Joshua G. Nickel ,  Jayesh Nath ,  Yijun Zhou ,  Hao Xu ,  Yuehui Ouyang ,  Nirali Shah ,  Mattia Pascolini ,  Robert W. Schlub ,  Ruben Caballero

IPC: H04B17/00 ,  H04W24/00 ,  H04W24/06

CPC classification number: H04W24/08 ,  H04B17/318 ,  H04B17/345 ,  H04W24/06

Abstract: Radio frequency test systems for characterizing antenna performance in various radio coexistence scenarios are provided. In one suitable arrangement, a test system may be used to perform passive radio coexistence characterization. During passive radio coexistence characterization, at least one signal generator may be used to feed aggressor signals directly to antennas within an electronic device under test (DUT). The aggressor signals may generate undesired interference signals in a victim frequency band, which can then be received and analyzed using a spectrum analyzer. During active radio coexistence characterization, at least one radio communications emulator may be used to communicate with a DUT via a first test antenna. While the DUT is communicating with the at least one radio communications emulator, test signals may also be conveyed between DUT 10 and a second test antenna. Test signals conveyed through the second test antenna may be used in obtaining signal interference level measurements.

Abstract translation: 提供了用于在各种无线电共存场景中表征天线性能的射频测试系统。 在一种合适的布置中，可以使用测试系统来执行被动无线电共存表征。 在被动无线电共存表征期间，可以使用至少一个信号发生器来将攻击者信号直接馈送到被测电子设备（DUT）内的天线。 攻击者信号可能在受害频段中产生不期望的干扰信号，然后使用频谱分析仪接收和分析。 在有源无线电共存表征期间，可以使用至少一个无线电通信仿真器来经由第一测试天线与DUT进行通信。 当DUT正在与至少一个无线电通信仿真器进行通信时，也可以在DUT 10和第二测试天线之间传送测试信号。 通过第二测试天线传送的测试信号可用于获得信号干扰电平测量。

公开(公告)号：US09164159B2

公开(公告)日：2015-10-20

申请号：US13715648

申请日：2012-12-14

Applicant: Apple Inc.

Inventor： Jayesh Nath ,  Liang Han ,  Matthew A. Mow ,  Ming-Ju Tsai ,  Joshua G. Nickel ,  Hao Xu ,  Peter Bevelacqua ,  Mattia Pascolini ,  Robert W. Schlub ,  Ruben Caballero

IPC: G01R35/00 ,  G01R31/319 ,  G01R31/28

CPC classification number: G01R35/007 ,  G01R31/2822 ,  G01R31/2879 ,  G01R31/3191

Abstract: A manufacturing system for assembling wireless electronic devices is provided. The manufacturing system may include test stations for testing the radio-frequency performance of components that are to be assembled within the electronic devices. A reference test station may be calibrated using calibration coupons having known radio-frequency characteristics. The calibration coupons may include transmission line structures. The reference test station may measure verification standards to establish baseline measurement data. The verification standards may include circuitry having electrical components with given impedance values. Many verification coupons may be measured to enable testing for a wide range of impedance values. Test stations in the manufacturing system may subsequently measure the verification standards to generate test measurement data. The test measurement data may be compared to the baseline measurement data to characterize the performance of the test stations to ensure consistent test measurements across the test stations.

Abstract translation: 提供了一种用于组装无线电子设备的制造系统。 制造系统可以包括用于测试要在电子设备内组装的组件的射频性能的测试站。 可以使用具有已知射频特性的校准试样来校准参考测试台。 校准试样可以包括传输线结构。 参考测试站可以测量验证标准以建立基线测量数据。 验证标准可以包括具有给定阻抗值的电气部件的电路。 可以测量许多验证券，以测试宽范围的阻抗值。 制造系统中的测试台随后可以测量验证标准以产生测试测量数据。 可以将测试测量数据与基线测量数据进行比较，以表征测试站的性能，以确保跨越测试站的一致的测试测量。

公开(公告)号：US20140179239A1

公开(公告)日：2014-06-26

申请号：US13725769

申请日：2012-12-21

Applicant: APPLE INC.

Inventor： Joshua G. Nickel ,  Jr-Yi Shen ,  Anand Lakshmanan ,  Jayesh Nath ,  Matthew A. Mow ,  Mattia Pascolini ,  Vishwanath Venkataraman ,  Peter Bevelacqua ,  Xin Cui

IPC: H04W24/00

CPC classification number: H04W24/00 ,  G01R27/26 ,  G01R27/28 ,  G01R29/08 ,  G01R29/10 ,  G01R31/2822 ,  H04B17/12

Abstract: A wireless electronic device may contain at least one adjustable antenna tuning element for use in tuning the operating frequency range of the device. The antenna tuning element may include radio-frequency switches, continuously/semi-continuously adjustable components such as tunable resistors, inductors, and capacitors, and other load circuits that provide desired impedance characteristics. A test system that is used for performing passive radio-frequency (RF) testing on antenna tuning elements in partially assembled devices is provided. The test system may include an RF tester and a test host. The tester may be used to gather scattering parameter measurements from the antenna tuning element. The test host may be used to ensure that power and appropriate control signals are being supplied to the antenna tuning element so that the antenna tuning element is placed in desired tuning states during testing.

Abstract translation: 无线电子设备可以包含用于调整设备的工作频率范围的至少一个可调天线调谐元件。 天线调谐元件可以包括射频开关，连续/半连续可调组件，例如可调电阻器，电感器和电容器，以及提供所需阻抗特性的其它负载电路。 提供了一种用于对部分组装的设备中的天线调谐元件进行无源射频（RF）测试的测试系统。 测试系统可以包括RF测试器和测试主机。 测试仪可用于从天线调谐元件收集散射参数测量值。 可以使用测试主机来确保向天线调谐元件提供功率和适当的控制信号，使得天线调谐元件在测试期间被置于期望的调谐状态。

公开(公告)号：US20150177277A1

公开(公告)日：2015-06-25

申请号：US14137770

申请日：2013-12-20

Applicant: Apple Inc.

Inventor： Joshua G. Nickel ,  Erica J. Tong ,  Vishwanath Venkataraman

IPC: G01R1/07 ,  G01R27/02 ,  G01R31/00

CPC classification number: G01R31/3025 ,  G01R31/2822

Abstract: A test system is provided for performing radio-frequency tests on an electronic device under test (DUT) having multiple antennas. The test system may include a test unit for generating radio-frequency test signals, a test enclosure, and a test antenna fixture. The test fixture may include tunable antenna circuitry, antenna tuning elements, a test sensor, a microcontroller, a battery, and a solar cell that charges the battery, each of which is mounted on a test fixture within the test enclosure. The test sensor may be used to detect stimuli issued by the DUT. In response to detecting the stimuli, the microcontroller may send control signals to the antenna tuning elements to configure the antenna circuitry in different modes. Each of the different modes may be optimized to test a selected one of the multiple antennas in the DUT when operating using different radio access technologies and at different frequencies.

Abstract translation: 提供了一种用于在具有多个天线的被测电子设备（DUT）上进行射频测试的测试系统。 测试系统可以包括用于产生射频测试信号的测试单元，测试机箱和测试天线固定装置。 测试夹具可以包括可调天线电路，天线调谐元件，测试传感器，微控制器，电池和对电池充电的太阳能电池，每个电池安装在测试外壳内的测试夹具上。 测试传感器可用于检测由DUT发出的刺激。 响应于检测到刺激，微控制器可以向天线调谐元件发送控制信号以将天线电路配置为不同的模式。 当使用不同的无线电接入技术和不同的频率进行操作时，可以优化每个不同的模式来测试DUT中的多个天线中的选定的一个。

公开(公告)号：US20140370821A1

公开(公告)日：2014-12-18

申请号：US13916090

申请日：2013-06-12

Applicant: Apple Inc.

Inventor： Jerzy Guterman ,  Joshua G. Nickel ,  Boon W. Shiu ,  Mattia Pascolini

IPC: H04B17/00 ,  H04W24/00

CPC classification number: H04W24/00 ,  H04W24/06

Abstract: A wireless electronic device may be provided with antenna structures. The antenna structures may be formed from an antenna ground and an array of antenna resonating elements formed along its periphery. The antenna resonating elements may be formed from metal traces on a dielectric support structure that surrounds the antenna ground. The electronic device may be tested using a test system for detecting the presence of manufacturing/assembly defects. The test system may include an RF tester and a test fixture. The device under test (DUT) may be attached to the test fixture during testing. Multiple test probes arranged along the periphery of the DUT may be used to transmit and receive RF test signals for gathering scattering parameter measurements on the device under test. The scattering parameter measurements may then be compared to predetermined threshold values to determine whether the DUT contains any defects.

Abstract translation: 无线电子设备可以设置有天线结构。 天线结构可以由天线接地和沿其周边形成的天线谐振元件的阵列形成。 天线谐振元件可以由围绕天线接地的电介质支撑结构上的金属迹线形成。 可以使用用于检测制造/组装缺陷的存在的测试系统来测试电子设备。 测试系统可以包括RF测试器和测试夹具。 被测设备（DUT）可以在测试期间连接到测试夹具。 沿着DUT周边布置的多个测试探头可用于发送和接收RF测试信号，用于在被测器件上采集散射参数测量。 然后可以将散射参数测量与预定阈值进行比较，以确定DUT是否包含任何缺陷。

公开(公告)号：US11114748B2

公开(公告)日：2021-09-07

申请号：US16563760

申请日：2019-09-06

Applicant: Apple Inc.

Inventor： Salih Yarga ,  Soroush Akbarzadeh ,  Jonathan M. Lee ,  Gareth L. Rose ,  Javier Gomez Tagle ,  Joshua G. Nickel ,  Mattia Pascolini ,  Ian A. Spraggs ,  Daniel W. Jarvis ,  Sunitha Seshadri

IPC: H01Q1/24 ,  H01Q5/30 ,  H01Q1/38 ,  H01Q5/25 ,  H01Q1/08

Abstract: An electronic device may have peripheral conductive housing structures divided into first and second segments. First and second antennas may be formed from the segments and may be fed using a flexible printed circuit structure. The structure may include a first substrate attached to the first segment, a second substrate soldered to the first substrate and attached to the second segment, and a third substrate soldered to the second substrate. Third and fourth antennas may be formed on the first substrate whereas fifth and sixth antennas are be formed on the second substrate. The second substrate may be folded and may have a lateral area oriented perpendicular to the third, fourth, fifth, and sixth antennas. Modularly forming the structure in this way may maximize the flexibility with which the structure can accommodate other components, thereby minimizing the space consumption associated with mounting and feeding the antennas without sacrificing wireless performance.

公开(公告)号：US09404842B2

公开(公告)日：2016-08-02

申请号：US13968166

申请日：2013-08-15

Applicant: Apple Inc.

Inventor： Joshua G. Nickel ,  Chun-Lung Chen ,  Tseng-Mau Yang ,  Nicholas G. Merz ,  Robert W. Schlub ,  Boon W. Shiu ,  Erica J. Tong

IPC: G01N19/04 ,  G01N3/56 ,  H04B17/00 ,  G01N3/08 ,  G01N3/24 ,  H04B17/16

CPC classification number: G01N3/56 ,  G01N3/08 ,  G01N3/24 ,  G01N19/04 ,  H04B17/16

Abstract: Damage to conductive material that serves as bridging connections between conductive structures within an electronic device may result in deficiencies in radio-frequency (RF) and other wireless communications. A test system for testing device structures under test is provided. Device structures under test may include substrates and a conductive material between the substrates. The test system may include a test fixture for increasing tensile or compressive stress on the device structures under test to evaluate the resilience of the conductive material. The test system may also include a test unit for transmitting RF test signals and receiving test data from the device structures under test. The received test data may include scattered parameter measurements from the device structures under test that may be used to determine if the device structures under test meet desired RF performance criteria.

Abstract translation: 用作电子设备内的导电结构之间桥接连接的导电材料的损坏可能导致射频（RF）和其他无线通信的缺陷。 提供了一种用于测试被测设备结构的测试系统。 被测器件结构可以包括衬底和衬底之间的导电材料。 测试系统可以包括用于增加被测装置结构上的拉伸或压缩应力以评估导电材料的弹性的测试夹具。 测试系统还可以包括用于发送RF测试信号并从被测设备结构接收测试数据的测试单元。 所接收的测试数据可以包括来自被测器件结构的散射参数测量，其可以用于确定被测器件结构是否满足期望的RF性能标准。

公开(公告)号：US09084124B2

公开(公告)日：2015-07-14

申请号：US13725769

申请日：2012-12-21

Applicant: Apple Inc.

Inventor： Joshua G. Nickel ,  Jr-Yi Shen ,  Anand Lakshmanan ,  Jayesh Nath ,  Matthew A. Mow ,  Mattia Pascolini ,  Vishwanath Venkataraman ,  Peter Bevelacqua ,  Xin Cui

IPC: H04B1/04 ,  H04W24/00 ,  G01R31/28 ,  H04B17/12 ,  G01R27/26 ,  G01R29/08 ,  G01R27/28 ,  G01R29/10

CPC classification number: H04W24/00 ,  G01R27/26 ,  G01R27/28 ,  G01R29/08 ,  G01R29/10 ,  G01R31/2822 ,  H04B17/12

Abstract: A wireless electronic device may contain at least one adjustable antenna tuning element for use in tuning the operating frequency range of the device. The antenna tuning element may include radio-frequency switches, continuously/semi-continuously adjustable components such as tunable resistors, inductors, and capacitors, and other load circuits that provide desired impedance characteristics. A test system that is used for performing passive radio-frequency (RF) testing on antenna tuning elements in partially assembled devices is provided. The test system may include an RF tester and a test host. The tester may be used to gather scattering parameter measurements from the antenna tuning element. The test host may be used to ensure that power and appropriate control signals are being supplied to the antenna tuning element so that the antenna tuning element is placed in desired tuning states during testing.

Abstract translation: 无线电子设备可以包含用于调整设备的工作频率范围的至少一个可调天线调谐元件。 天线调谐元件可以包括射频开关，连续/半连续可调组件，例如可调电阻器，电感器和电容器，以及提供所需阻抗特性的其它负载电路。 提供了一种用于对部分组装的设备中的天线调谐元件进行无源射频（RF）测试的测试系统。 测试系统可以包括RF测试器和测试主机。 测试仪可用于从天线调谐元件收集散射参数测量值。 可以使用测试主机来确保向天线调谐元件提供功率和适当的控制信号，使得天线调谐元件在测试期间被置于期望的调谐状态。