公开(公告)号：US20200158771A1

公开(公告)日：2020-05-21

申请号：US16743878

申请日：2020-01-15

Applicant: Analog Devices Global

Inventor： Alan J. O'Donnell ,  David Aherne ,  Javier Alejandro Salcedo ,  David J. Clarke ,  John A. Cleary ,  Patrick Martin McGuinness ,  Albert C. O'Grady

IPC: G01R31/00 ,  G08B21/18 ,  H02H1/00 ,  H02H9/04

Abstract: Aspects of this disclosure relate to detecting and recording information associated with electrical overstress (EOS) events, such as electrostatic discharge (ESD) events. For example, in one embodiment, an apparatus includes an electrical overstress protection device, a detection circuit configured to detect an occurrence of the EOS event, and a memory configured to store information indicative of the EOS event.

公开(公告)号：US11193967B2

公开(公告)日：2021-12-07

申请号：US16743878

申请日：2020-01-15

Applicant: Analog Devices Global

Inventor： Alan J. O'Donnell ,  David Aherne ,  Javier Alejandro Salcedo ,  David J. Clarke ,  John A. Cleary ,  Patrick Martin McGuinness ,  Albert C. O'Grady

IPC: G01R31/00 ,  G08B21/18 ,  H02H1/00 ,  H02H9/04 ,  H02H3/20 ,  H05K1/02 ,  H02H9/00 ,  H01L27/02 ,  H02H3/04

Abstract: Aspects of this disclosure relate to detecting and recording information associated with electrical overstress (EOS) events, such as electrostatic discharge (ESD) events. For example, in one embodiment, an apparatus includes an electrical overstress protection device, a detection circuit configured to detect an occurrence of the EOS event, and a memory configured to store information indicative of the EOS event.

公开(公告)号：US10557881B2

公开(公告)日：2020-02-11

申请号：US15801132

申请日：2017-11-01

Applicant: Analog Devices Global

Inventor： Alan J. O'Donnell ,  David Aherne ,  Javier Alejandro Salcedo ,  David J. Clarke ,  John A. Cleary ,  Patrick Martin McGuinness ,  Albert C. O'Grady

IPC: G01R31/00 ,  G08B21/18 ,  H02H1/00 ,  H02H9/04 ,  H02H3/20 ,  H05K1/02 ,  H02H9/00

Abstract: Aspects of this disclosure relate to detecting and recording information associated with electrical overstress (EOS) events, such as electrostatic discharge (ESD) events. For example, in one embodiment, an apparatus includes an electrical overstress protection device, a detection circuit configured to detect an occurrence of the EOS event, and a memory configured to store information indicative of the EOS event.

公开(公告)号：US20190128939A1

公开(公告)日：2019-05-02

申请号：US15801132

申请日：2017-11-01

Applicant: Analog Devices Global

Inventor： Alan J. O'Donnell ,  David Aherne ,  Javier Alejandro Salcedo ,  David J. Clarke ,  John A. Cleary ,  Patrick Martin McGuinness ,  Albert C. O'Grady

IPC: G01R31/00 ,  H02H1/00 ,  G08B21/18

Abstract: Aspects of this disclosure relate to detecting and recording information associated with electrical overstress (EOS) events, such as electrostatic discharge (ESD) events. For example, in one embodiment, an apparatus includes an electrical overstress protection device, a detection circuit configured to detect an occurrence of the EOS event, and a memory configured to store information indicative of the EOS event.

公开(公告)号：US09871373B2

公开(公告)日：2018-01-16

申请号：US14671767

申请日：2015-03-27

Applicant: Analog Devices Global

Inventor： Alan J. O'Donnell ,  David Aherne ,  Javier Alejandro Salcedo ,  David J. Clarke ,  John A. Cleary ,  Patrick Martin McGuinness ,  Albert C. O'Grady

IPC: H02H3/22 ,  H02H9/04 ,  H02H9/02 ,  H01L27/02

CPC classification number: H02H9/04 ,  H01L27/0248 ,  H01L2224/32145 ,  H01L2224/48091 ,  H01L2224/48247 ,  H01L2224/73265 ,  H01L2924/181 ,  H02H9/02 ,  H02H9/042 ,  H02H9/046 ,  H01L2924/00012 ,  H01L2924/00014 ,  H01L2924/00

Abstract: Aspects of this disclosure relate to detecting and recording information associated with electrical overstress (EOS) events, such as electrostatic discharge (ESD) events. For example, in one embodiment, an apparatus includes an electrical overstress protection device, a detection circuit configured to detect an occurrence of the EOS event, and a memory configured to store information indicative of the EOS event.

公开(公告)号：US20160285255A1

公开(公告)日：2016-09-29

申请号：US14671767

申请日：2015-03-27

Applicant: Analog Devices Global

Inventor： Alan J. O'Donnell ,  David Aherne ,  Javier Alejandro Salcedo ,  David J. Clarke ,  John A. Cleary ,  Patrick Martin McGuinness ,  Albert C. O'Grady

IPC: H02H9/04 ,  H02H9/02

CPC classification number: H02H9/04 ,  H01L27/0248 ,  H01L2224/32145 ,  H01L2224/48091 ,  H01L2224/48247 ,  H01L2224/73265 ,  H01L2924/181 ,  H02H9/02 ,  H02H9/042 ,  H02H9/046 ,  H01L2924/00012 ,  H01L2924/00014 ,  H01L2924/00

Abstract: Aspects of this disclosure relate to detecting and recording information associated with electrical overstress (EOS) events, such as electrostatic discharge (ESD) events. For example, in one embodiment, an apparatus includes an electrical overstress protection device, a detection circuit configured to detect an occurrence of the EOS event, and a memory configured to store information indicative of the EOS event.

Abstract translation: 本公开的方面涉及检测和记录与电应力（EOS）事件相关的信息，例如静电放电（ESD）事件。 例如，在一个实施例中，一种装置包括电过压保护装置，被配置为检测EOS事件的发生的检测电路，以及被配置为存储指示EOS事件的信息的存储器。