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公开(公告)号：US09939476B2
公开(公告)日：2018-04-10
申请号：US14866036
申请日：2015-09-25
Applicant: ANALOG DEVICES GLOBAL
Inventor： Christian Steffen Birk , John A. Cleary , David Sayago Montilla , Elizabeth A. Lillis , Padraig O'Connor , Eoin E. English , Patrick Pratt , Kathleen Embrechts , Wim Rens , Jan Crols
CPC classification number: G01R27/2605 , B81B2201/0235 , B81C99/003
Abstract: Embodiments of the present invention may provide a method of measuring an unknown capacitance of a device. The method may comprise the steps of driving a test signal to a circuit system that includes a current divider formed by the device with unknown capacitance and a reference capacitor; mirroring a current developed in the reference capacitor to a second circuit system that includes a measurement impedance; measuring a voltage within the second circuit system; and deriving a capacitance of the unknown capacitance based on the measured voltage with reference to a capacitance of the reference capacitor and the measurement impedance.
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公开(公告)号：US20170089966A1
公开(公告)日：2017-03-30
申请号：US14866036
申请日：2015-09-25
Applicant: ANALOG DEVICES GLOBAL
Inventor： Christian Steffen Birk , John A. Cleary , David Sayago Montilla , Elizabeth A. Lillis , Padraig O'Connor , Eoin E. English , Patrick Pratt , Kathleen Embrechts , Wim Rens , Jan Crols
IPC: G01R27/26
CPC classification number: G01R27/2605 , B81B2201/0235 , B81C99/003
Abstract: Embodiments of the present invention may provide a method of measuring an unknown capacitance of a device. The method may comprise the steps of driving a test signal to a circuit system that includes a current divider formed by the device with unknown capacitance and a reference capacitor; mirroring a current developed in the reference capacitor to a second circuit system that includes a measurement impedance; measuring a voltage within the second circuit system; and deriving a capacitance of the unknown capacitance based on the measured voltage with reference to a capacitance of the reference capacitor and the measurement impedance.
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公开(公告)号：US09525407B2
公开(公告)日：2016-12-20
申请号：US14204851
申请日：2014-03-11
Applicant: Analog Devices Global
Inventor： Santiago Iriarte , John A. Cleary
CPC classification number: H03K5/2472
Abstract: A power supply monitoring circuit for monitoring a voltage at a power supply node compared to a reference node, the power supply monitoring circuit comprising a first field effect transistor and first and second voltage dropping components arranged in current flow communication between the power supply node and the reference node and each having first and second nodes, and wherein a first node of the first voltage dropping component is connected to one of the first and second nodes of the field effect transistor, and a gate of the field effect transistor is connected to the second node of the first voltage dropping component, and an output signal is taken from a connection made with the first field effect transistor.
Abstract translation: 一种电源监视电路，用于监视与参考节点相比的电源节点处的电压，所述电源监视电路包括第一场效应晶体管和第一和第二降压组件，所述第一和第二降压组件以电流节点和 参考节点，并且每个具有第一和第二节点，并且其中第一降压部件的第一节点连接到场效应晶体管的第一和第二节点中的一个，并且场效应晶体管的栅极连接到第二节点 第一降压组件的节点，并且输出信号取自与第一场效应晶体管制成的连接。
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公开(公告)号：US10700668B2
公开(公告)日：2020-06-30
申请号：US16010219
申请日：2018-06-15
Applicant: Analog Devices Global Unlimited Company
Inventor： David Sayago , Thomas F. Roche , John A. Cleary
Abstract: The present disclosure provides a pulse generator which generates a pulse train by mixing pulses of a first clock having a first frequency, with pulses of a second clock having a second frequency. Over a predefined time period, the combination of pulses results in a pulse train having an effective frequency which is between the first and second frequencies. A multiplexer is used to select which of the first and second clocks should be provided to the output. Depending on the desired target frequency, the multiplexer is controlled to mix differing amounts of pulses from the first and second clocks. A multiplexer is controlled by a control signal, which is generated using combinatorial logic using the first clock as an input. The pulse generator may be used, for example, as a clock for a charge pump.
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公开(公告)号：US20200158771A1
公开(公告)日：2020-05-21
申请号：US16743878
申请日：2020-01-15
Applicant: Analog Devices Global
Inventor： Alan J. O'Donnell , David Aherne , Javier Alejandro Salcedo , David J. Clarke , John A. Cleary , Patrick Martin McGuinness , Albert C. O'Grady
Abstract: Aspects of this disclosure relate to detecting and recording information associated with electrical overstress (EOS) events, such as electrostatic discharge (ESD) events. For example, in one embodiment, an apparatus includes an electrical overstress protection device, a detection circuit configured to detect an occurrence of the EOS event, and a memory configured to store information indicative of the EOS event.
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Patent Agency Ranking
公开(公告)号：US11193967B2
公开(公告)日：2021-12-07
申请号：US16743878
申请日：2020-01-15
Applicant: Analog Devices Global
Inventor： Alan J. O'Donnell , David Aherne , Javier Alejandro Salcedo , David J. Clarke , John A. Cleary , Patrick Martin McGuinness , Albert C. O'Grady
IPC: G01R31/00 , G08B21/18 , H02H1/00 , H02H9/04 , H02H3/20 , H05K1/02 , H02H9/00 , H01L27/02 , H02H3/04
Abstract: Aspects of this disclosure relate to detecting and recording information associated with electrical overstress (EOS) events, such as electrostatic discharge (ESD) events. For example, in one embodiment, an apparatus includes an electrical overstress protection device, a detection circuit configured to detect an occurrence of the EOS event, and a memory configured to store information indicative of the EOS event.
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公开(公告)号：US10557881B2
公开(公告)日：2020-02-11
申请号：US15801132
申请日：2017-11-01
Applicant: Analog Devices Global
Inventor： Alan J. O'Donnell , David Aherne , Javier Alejandro Salcedo , David J. Clarke , John A. Cleary , Patrick Martin McGuinness , Albert C. O'Grady
Abstract: Aspects of this disclosure relate to detecting and recording information associated with electrical overstress (EOS) events, such as electrostatic discharge (ESD) events. For example, in one embodiment, an apparatus includes an electrical overstress protection device, a detection circuit configured to detect an occurrence of the EOS event, and a memory configured to store information indicative of the EOS event.
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公开(公告)号：US20190128939A1
公开(公告)日：2019-05-02
申请号：US15801132
申请日：2017-11-01
Applicant: Analog Devices Global
Inventor： Alan J. O'Donnell , David Aherne , Javier Alejandro Salcedo , David J. Clarke , John A. Cleary , Patrick Martin McGuinness , Albert C. O'Grady
Abstract: Aspects of this disclosure relate to detecting and recording information associated with electrical overstress (EOS) events, such as electrostatic discharge (ESD) events. For example, in one embodiment, an apparatus includes an electrical overstress protection device, a detection circuit configured to detect an occurrence of the EOS event, and a memory configured to store information indicative of the EOS event.
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公开(公告)号：US09871373B2
公开(公告)日：2018-01-16
申请号：US14671767
申请日：2015-03-27
Applicant: Analog Devices Global
Inventor： Alan J. O'Donnell , David Aherne , Javier Alejandro Salcedo , David J. Clarke , John A. Cleary , Patrick Martin McGuinness , Albert C. O'Grady
CPC classification number: H02H9/04 , H01L27/0248 , H01L2224/32145 , H01L2224/48091 , H01L2224/48247 , H01L2224/73265 , H01L2924/181 , H02H9/02 , H02H9/042 , H02H9/046 , H01L2924/00012 , H01L2924/00014 , H01L2924/00
Abstract: Aspects of this disclosure relate to detecting and recording information associated with electrical overstress (EOS) events, such as electrostatic discharge (ESD) events. For example, in one embodiment, an apparatus includes an electrical overstress protection device, a detection circuit configured to detect an occurrence of the EOS event, and a memory configured to store information indicative of the EOS event.
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公开(公告)号：US20160285255A1
公开(公告)日：2016-09-29
申请号：US14671767
申请日：2015-03-27
Applicant: Analog Devices Global
Inventor： Alan J. O'Donnell , David Aherne , Javier Alejandro Salcedo , David J. Clarke , John A. Cleary , Patrick Martin McGuinness , Albert C. O'Grady
CPC classification number: H02H9/04 , H01L27/0248 , H01L2224/32145 , H01L2224/48091 , H01L2224/48247 , H01L2224/73265 , H01L2924/181 , H02H9/02 , H02H9/042 , H02H9/046 , H01L2924/00012 , H01L2924/00014 , H01L2924/00
Abstract: Aspects of this disclosure relate to detecting and recording information associated with electrical overstress (EOS) events, such as electrostatic discharge (ESD) events. For example, in one embodiment, an apparatus includes an electrical overstress protection device, a detection circuit configured to detect an occurrence of the EOS event, and a memory configured to store information indicative of the EOS event.
Abstract translation: 本公开的方面涉及检测和记录与电应力（EOS）事件相关的信息，例如静电放电（ESD）事件。 例如，在一个实施例中，一种装置包括电过压保护装置，被配置为检测EOS事件的发生的检测电路，以及被配置为存储指示EOS事件的信息的存储器。
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