公开(公告)号：US10114781B2

公开(公告)日：2018-10-30

申请号：US15243824

申请日：2016-08-22

Applicant: Apple Inc.

Inventor： Colin Whitby-Strevens ,  Kevin M. Keeler ,  Christophe B. Daniel

IPC: G06F3/00 ,  G06F13/38 ,  G06F13/42 ,  G06F11/30 ,  G06F13/40

Abstract: Methods, structures, and apparatus that limit the amount of dendritic growth and metal migration between contacts in order to prevent an erroneous detection of a connection and/or functional failure. One example may reduce dendritic growth and metal migration by limiting an amount of time that a connection detection voltage is applied to CC contacts of a USB Type-C connector when an electronic device is detecting a connection. This and other examples may further limit dendritic growth by not applying the connection detection voltage to the CC contacts for a first duration following a detection of a disconnection.

公开(公告)号：US20170124010A1

公开(公告)日：2017-05-04

申请号：US15243824

申请日：2016-08-22

Applicant: Apple Inc.

Inventor： Colin Whitby-Strevens ,  Kevin M. Keeler ,  Christophe B. Daniel

IPC: G06F13/38 ,  G06F11/30 ,  G06F13/42

CPC classification number: G06F13/385 ,  G06F11/3041 ,  G06F11/3048 ,  G06F11/3051 ,  G06F13/4068 ,  G06F13/4282

Abstract: Methods, structures, and apparatus that limit the amount of dendritic growth and metal migration between contacts in order to prevent an erroneous detection of a connection and/or functional failure. One example may reduce dendritic growth and metal migration by limiting an amount of time that a connection detection voltage is applied to CC contacts of a USB Type-C connector when an electronic device is detecting a connection. This and other examples may further limit dendritic growth by not applying the connection detection voltage to the CC contacts for a first duration following a detection of a disconnection.