公开(公告)号：US11886253B1

公开(公告)日：2024-01-30

申请号：US16289607

申请日：2019-02-28

Applicant: Apple Inc.

Inventor： John C. Difonzo ,  Hao Zhu ,  Bryce W. Wilson ,  Andrea Del Prete ,  Stefano Tizianel ,  Noemi Novello ,  Maurizio Bertoldo

IPC: G06F1/16 ,  H01F13/00 ,  H01F7/02

CPC classification number: G06F1/1679 ,  G06F1/1616 ,  H01F7/0263 ,  H01F13/006

Abstract: This application relates to improving kinematics in a computing device such as a laptop computer. A magnetic latch mechanism includes a magnetic array and an attractor plate. The magnetic array is secured in a top portion of the laptop computer and the attractor plate is secured in a base portion of the laptop computer. An attractive force of the magnetic latch mechanism is calibrated by selectively demagnetizing a portion of one or more magnetic elements in the magnetic array to reduce the attractive force proximate a target force. The calibration technique can include exciting a demagnetizing element, such as a pair of conductive coils, with a short, high frequency demagnetization pulse to create a demagnetized zone within the magnetic array that is completely demagnetized, irrespective of unit to unit variations of magnetic properties in the initially magnetized magnetic array. This technique ensures an accurate kinematic user experience.

公开(公告)号：US10006974B2

公开(公告)日：2018-06-26

申请号：US15272352

申请日：2016-09-21

Applicant: Apple Inc.

Inventor： John C. Difonzo ,  Maurizio Bertoldo

IPC: B03C1/00 ,  G01R33/12 ,  G01R33/038

CPC classification number: G01R33/0385

Abstract: An automated magnet quality measurement system includes a magnet measuring component and an automated magnet moving component. The magnet measuring component can be configured to measure EMF for a plurality of magnets. The automated magnet moving component can move each of the plurality of magnets into and out of the magnet measuring component without requiring any manual intervention, with only one of the plurality of magnets being within the magnet measuring component at a given time. The magnet measuring component can be a Helmholtz coil and the automated magnet moving component can be a rotating disk. The overall system can also include a loading system configured to load each of the magnets onto the automated magnet moving component on an individual and sequential basis, and a sorting system configured to sort the magnets based upon their EMF measurements.