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    MAGNETIC SENSOR DEVICE
    3.
    发明申请
    MAGNETIC SENSOR DEVICE 审中-公开

    公开(公告)号：US20180306873A1

    公开(公告)日：2018-10-25

    申请号：US15524812

    申请日：2016-01-26

    申请人： MITSUBISHI ELECTRIC CORPORATION

    发明人： Hideki Matsui ,  Tatsuya Kunieda ,  Tomokazu Ogomi ,  Masaaki Okada ,  Sadaaki Yoshioka

    IPC分类号： G01R33/038 ,  G07D7/04 ,  G01D5/16 ,  G01R33/09

    CPC分类号： G01R33/0385 ,  G01D5/16 ,  G01R33/02 ,  G01R33/09 ,  G01R33/091 ,  G01R33/096 ,  G07D7/04

    摘要： A magnetic sensor device that includes: a bar-shaped magnet; a soft magnetic carrier that is arranged parallel to magnet along the longitudinal direction of magnet, that has a magnetoresistive effect element on a surface thereof opposite to a surface facing magnet, and that extends across the lateral length of magnet; and a guide that has a bottom interposed between magnet and carrier and a side wall standing upright from the bottom along a side of magnet contacting a surface of magnet facing carrier, the bottom and the side wall being formed of a nonmagnetic body contacting magnet and extending in the longitudinal direction of magnet. The magnet is attracted to and held by the carrier, with the guide interposed therebetween, due to the magnetic attractive force between the magnet and the carrier.

    Magnetic force microscope and magnetic field observation method using same
    6.
    发明授权
    Magnetic force microscope and magnetic field observation method using same 有权
    磁力显微镜和磁场观察法使用相同

    公开(公告)号：US08912789B2

    公开(公告)日：2014-12-16

    申请号：US13479860

    申请日：2012-05-24

    申请人： Seiji Heike

    发明人： Seiji Heike

    IPC分类号： G01B7/14 ,  G01Q60/56 ,  G01R33/038 ,  B82Y35/00

    CPC分类号： G01R33/0385 ,  B82Y35/00 ,  G01Q60/56

    摘要： A magnetic force microscope capable of measuring the absolute value of a magnetic field with high resolution without causing a change in magnetization state of the probe. The magnetic force microscope includes a cantilever, a probe, a displacement detector that detects a displacement of the probe, a specimen carrier, and various transfer units. The magnetic force microscope that measures an undulation distribution as well as a magnetic field distribution on the surface of a specimen placed on the specimen carrier is further provided with a magnetic-field impress-unit that impresses a magnetic field to the probe, and an output of the magnetic-field impress-unit is controlled such that a magnetic force impressed onto the probe 5 is turned zero to thereby measure a magnetic field distribution on the surface of the specimen.

    摘要翻译： 能够以高分辨率测量磁场的绝对值而不引起探针的磁化状态变化的磁力显微镜。 磁力显微镜包括悬臂，探针，位移检测器，其检测探针的位移，试样载体和各种转移单元。 测量放置在试样载体上的试样表面上的波动分布以及磁场分布的磁力显微镜还设置有向探针施加磁场的磁场印迹单元，以及输出 控制磁场印迹单元的位置，使得施加到探针5上的磁力变为零，从而测量样本表面上的磁场分布。

    MAGNETIC PROFILE MEASURING DEVICE AND METHOD FOR MEASURING MAGNETIC PROFILE FOR ALTERNATING-CURRENT MAGNETIC FIELD
    7.
    发明申请
    MAGNETIC PROFILE MEASURING DEVICE AND METHOD FOR MEASURING MAGNETIC PROFILE FOR ALTERNATING-CURRENT MAGNETIC FIELD 有权
    磁性轮廓测量装置及用于测量电流磁场的磁轮廓的方法

    公开(公告)号：US20140218016A1

    公开(公告)日：2014-08-07

    申请号：US14347417

    申请日：2012-09-25

    申请人： AKITA UNIVERSITY

    发明人： Hitoshi Saito ,  Satoru Yoshimura

    IPC分类号： G01N27/72

    CPC分类号： G01N27/725 ,  B82Y35/00 ,  G01Q30/04 ,  G01Q60/54 ,  G01R33/0385

    摘要： A magnetic profile measuring device which scans a space where an alternating-current magnetic field exists by a magnetized probe on a tip of a driven cantilever, detects vibration of the cantilever, and generates an image of magnetic field distribution of the space, the device including: the cantilever having the probe equipped on the tip thereof; a driver driving the cantilever; a vibration sensor detecting vibration of the probe wherein the driven vibration of the cantilever is frequency-modulated by the alternating-current magnetic field; a demodulator demodulating from a detection signal of the vibration sensor a magnetic signal corresponding to an alternating-current magnetic field; a scanning mechanism; a data storage storing an initial data for each coordinate of the space; a modified data generator recalling the initial data from the data storage and generating a plurality of data by modifying the phase of the initial data; and an image display device.

    摘要翻译： 扫描由驱动悬臂的尖端上的磁化探针存在交流磁场的空间的磁轮廓测量装置检测悬臂的振动，并产生空间的磁场分布图像，该装置包括 ：悬臂，其顶部装有探头; 驾驶悬臂的司机 振动传感器，其检测所述探针的振动，其中所述悬臂的驱动振动由所述交流磁场进行调频; 解调器，根据所述振动传感器的检测信号，对应于交流磁场的磁信号进行解调; 扫描机制; 存储空间的每个坐标的初始数据的数据存储器; 修改后的数据生成器通过修改初始数据的相位来从数据存储器回调初始数据并产生多个数据; 和图像显示装置。

    HIGH SENSITIVITY MAGNETOELECTRIC MAGNETOMETER
    8.
    发明申请
    HIGH SENSITIVITY MAGNETOELECTRIC MAGNETOMETER 审中-公开
    高灵敏度磁电磁铁

    公开(公告)号：US20140159713A1

    公开(公告)日：2014-06-12

    申请号：US14093018

    申请日：2013-11-28

    申请人： Nersesse Nersessian

    发明人： Nersesse Nersessian

    IPC分类号： G01R33/02 ,  G01R33/038

    CPC分类号： G01R33/0385 ,  G01R33/0286 ,  G01V3/08

    摘要： Some implementations provide a magnetoelectric magnetometer that includes a piezoelectric layer having a first end portion, a second end portion, and a third portion. The third portion is located between the first end portion and the second end portion. The magnetoelectric magnetometer includes a magnetostrictive element coupled to the third portion of the piezoelectric layer. The magnetostrictive element and the piezoelectric layer are configured to amplify a magnetically induced stress in the magnetostrictive element to the piezoelectric layer, resulting in an electrical response from the piezoelectric layer. The first and second end portions of the piezoelectric layer are fixed, while the third portion is free to bend.

    摘要翻译： 一些实施方案提供了一种磁电磁力计，其包括具有第一端部，第二端部和第三部分的压电层。 第三部分位于第一端部和第二端部之间。 磁电磁力计包括耦合到压电层的第三部分的磁致伸缩元件。 磁致伸缩元件和压电层被构造成将磁致伸缩元件中的磁致应力放大到压电层，导致来自压电层的电响应。 压电层的第一和第二端部是固定的，而第三部分是自由弯曲的。

    CALCULATING METHOD OF MAGNETIC FORCE CHARACTERISTIC, AND MAGNETIC FORCE CHARACTERISTIC COMPUTING DEVICE
    9.
    发明申请
    CALCULATING METHOD OF MAGNETIC FORCE CHARACTERISTIC, AND MAGNETIC FORCE CHARACTERISTIC COMPUTING DEVICE 有权
    磁力特征计算方法及磁力特征计算装置

    公开(公告)号：US20140046608A1

    公开(公告)日：2014-02-13

    申请号：US14112911

    申请日：2012-05-15

    申请人： Mitsutoshi Natsumeda

    发明人： Mitsutoshi Natsumeda

    IPC分类号： G01R33/16

    CPC分类号： G01R33/16 ,  G01R33/0064 ,  G01R33/0385 ,  H01F41/0293

    摘要： A prestored database indicating a correspondence of δ (depth)/ΔHcJ (coercivity increment) and a prestored database indicating information of Dy diffusion condition (diffusion coefficient, diffusion flux and processing time regarding Dy diffusion) are used to compute distribution of Dy introduction amount in a magnet from shape information of the magnet and information of a Dy introduction face and compute distribution of ΔHcJ in the magnet from the distribution of Dy introduction amount. Regarding a magnet having a coercivity that is distributed non-uniformly, a J/H curve is computed using the computed distribution of ΔHcJ, and a demagnetizing factor at a predetermined temperature is computed using a temperature coefficient.

    摘要翻译： 使用表示δ（深度）/ DeltaHcJ（矫顽力增量）的对应关系的预先存储的数据库和指示Dy扩散条件（扩散系数，扩散通量和Dy扩散的处理时间）的信息的预存数据库来计算Dy引入量的分布 来自磁体的形状信息的磁体和Dy引入面的信息，并且从Dy引入量的分布计算磁体中的DeltaHcJ的分布。 关于矫顽力分布不均匀的磁体，使用计算出的DeltaHcJ分布来计算J / H曲线，并且使用温度系数计算预定温度下的退磁系数。