公开(公告)号：US09689825B1

公开(公告)日：2017-06-27

申请号：US14481356

申请日：2014-09-09

Applicant: Apple Inc.

Inventor： Richard W. Lim ,  Benjamin B. Lyon ,  Srdjan D. Sobajic ,  Giovanni Gozzini ,  Peter G. Panagas

IPC: G01N27/24 ,  G01R31/28 ,  G01R27/26

CPC classification number: G01N27/24 ,  G01R27/2605 ,  G01R31/2829 ,  G06K9/0002

Abstract: A system for testing a first layer disposed over a capacitive sensing device includes a test probe having a substantially flat conductive test surface, a device under test (DUT) disposed over the capacitive sensing device, and a power supply operatively connected to the test probe. The DUT can include the first layer and one or more additional layers. The substantially flat conductive test surface is positioned over a surface of the DUT and applies power to the DUT. The capacitance between the test probe and at least one capacitive sensing element in the capacitive sensing device is then measured.