公开(公告)号：US10739247B2

公开(公告)日：2020-08-11

申请号：US16176834

申请日：2018-10-31

Applicant: BAE Systems Information and Electronic Systems Integration Inc.

Inventor： Bryan D. Lee ,  Christopher M. Palie ,  Andrew J. Radl

IPC: G01D5/32 ,  G01N15/14

Abstract: A system and process for testing and analyzing a laser beam is provided. The system and process allows for repeatable testing of a laser beam to provide a beam intensity profile while accounting for variation in measurements attributable to outside factors. The system and process further allows for simultaneous measurement and analysis of a laser beam having multiple wavelengths.

公开(公告)号：US20200132591A1

公开(公告)日：2020-04-30

申请号：US16176834

申请日：2018-10-31

Applicant: BAE Systems Information and Electronic Systems Integration Inc.

Inventor： Bryan D. Lee ,  Christopher M. Palie ,  Andrew J. Radl

IPC: G01N15/14 ,  G01D5/32

Abstract: A system and process for testing and analyzing a laser beam is provided. The system and process allows for repeatable testing of a laser beam to provide a beam intensity profile while accounting for variation in measurements attributable to outside factors. The system and process further allows for simultaneous measurement and analysis of a laser beam having multiple wavelengths.