COMPUTER-IMPLEMENTED METHOD AND DEVICE FOR MONITORING A PLANT

    公开(公告)号:US20250067630A1

    公开(公告)日:2025-02-27

    申请号:US18721004

    申请日:2023-01-16

    Applicant: BASF SE

    Abstract: Disclosed herein is a method for monitoring a plant capable of: receiving one or more educts; and executing multiple processes in which the educts are processed, where each of the processes is characterized by an associated set of process parameters; the method including: comparing a set of process parameters of interest and the remaining sets of process parameters associated with the remaining multiple executed processes to determine a similarity degree between the set of process parameters of interest and the remaining sets of process parameters; determining at least one similar process from the remaining multiple executed processes, the similar process having a similarity degree that is equal to or greater than a similarity threshold; and outputting the set of process parameters of interest together with the set of process parameters associated with the determined at least one similar process.

    MONITORING AND/OR CONTROLLING A PLANT VIA A MACHINE-LEARNING REGRESSOR

    公开(公告)号:US20240241483A1

    公开(公告)日:2024-07-18

    申请号:US18559102

    申请日:2022-05-27

    Applicant: BASF SE

    CPC classification number: G05B13/0265

    Abstract: Disclosed herein is a computer-implemented regressor for simulating, monitoring and/or controlling a batch plant. The batch plant is implemented to receive one or more educts having associated educt quality parameters (x1, x2), to process the educt(s) where the process has associated process parameters (yj), and to output a product having associated product quality parameters (Q1, Q2). The regressor includes at least two regressor units based on machine-learning principles, each regressor unit having an input for receiving input data, and an output for outputting output data. A first regressor unit is implemented to receive the educt quality parameters (xi) and to output at least one educt impact parameter (R1). And a second regressor unit is implemented to receive the educt impact parameter (R1) and l process parameters (yj) and to output at least one product quality parameter (Qj).

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