公开(公告)号：US20250067630A1

公开(公告)日：2025-02-27

申请号：US18721004

申请日：2023-01-16

Applicant: BASF SE

Inventor： Alexander BADINSKI ,  PHILLIP RUEHL ,  Martin DIERKEN ,  Sebastian STEINHAEUSER ,  Harro BONNOWITZ ,  Heiko KULINNA

IPC: G01M99/00

Abstract: Disclosed herein is a method for monitoring a plant capable of: receiving one or more educts; and executing multiple processes in which the educts are processed, where each of the processes is characterized by an associated set of process parameters; the method including: comparing a set of process parameters of interest and the remaining sets of process parameters associated with the remaining multiple executed processes to determine a similarity degree between the set of process parameters of interest and the remaining sets of process parameters; determining at least one similar process from the remaining multiple executed processes, the similar process having a similarity degree that is equal to or greater than a similarity threshold; and outputting the set of process parameters of interest together with the set of process parameters associated with the determined at least one similar process.