公开(公告)号：US20240425294A1

公开(公告)日：2024-12-26

申请号：US18497923

申请日：2023-10-30

Applicant: CONTEMPORARY AMPEREX TECHNOLOGY CO., LIMITED

Inventor： Kai ZHOU ,  Xueqing Gong ,  Guangwei Zhou ,  Jiawu Cheng

IPC: B65G43/08 ,  G01K13/00 ,  H01M10/04

Abstract: The present application relates to a detection mechanism and a battery production line. The detection mechanism includes a conveying unit, configured to convey the device to be detected; a first detection unit, configured to detect the temperature of the device to be detected; and a trigger unit, configured to detect the distance between the first detection unit and the device to be detected. When the distance between the first detection unit and the device to be detected is less than a preset distance value, the trigger unit controls the conveying unit to stop conveying. The detection mechanism and the battery production line in the embodiments of the present application can ameliorate the problem of poor universality.

公开(公告)号：US20240426937A1

公开(公告)日：2024-12-26

申请号：US18521800

申请日：2023-11-28

Applicant: CONTEMPORARY AMPEREX TECHNOLOGY CO., LIMITED

Inventor： Jiawu CHENG ,  Xueqing GONG ,  Guangwei ZHOU ,  Kai ZHOU ,  Haijie WANG

IPC: G01R31/396 ,  G01R31/3835 ,  G01R31/389 ,  H04N7/18 ,  H04N23/56

Abstract: A test system comprises a test circuit board, a test device, a lower computer, and an upper computer. The test circuit board includes a test circuit, the test circuit comprising multiple main lines arranged side by side, one end of each of the main lines being used to connect with a positive electrode or a negative electrode of each battery cell of the battery module, and the other end of each of the main lines being connected with a first branch and a second branch. The lower computer controls a first branch connected to one of the main lines to be electrically conductive to a positive electrode of the test device and a second branch connected to another one of the main lines to be electrically conductive to a negative electrode of the test device. The upper computer controls the lower computer and reads parameter information for the test device.