公开(公告)号：US20170229191A1

公开(公告)日：2017-08-10

申请号：US15019590

申请日：2016-02-09

Applicant: GLOBALFOUNDRIES INC.

Inventor： Michael R. Ouellette ,  Deepak I. Hanagandi ,  Aravindan J. Busi ,  Kiran K. Narayan ,  Michael A. Ziegerhofer

IPC: G11C29/44 ,  G11C29/36

CPC classification number: G11C29/44 ,  G11C29/10 ,  G11C29/36 ,  G11C29/4401 ,  G11C2029/3602 ,  G11C2029/4402

Abstract: Approaches for a memory built-in self-test (MBIST) are provided. The MBIST circuit includes a fail status register which receives a new fail signal value in response to a detection of a unique fail in a pattern, and a pattern mask register which stores at an end of the pattern a different value of the new fail signal value representative of the unique fail.