-
1.
公开(公告)号:US10432325B1
公开(公告)日:2019-10-01
申请号:US16002837
申请日:2018-06-07
Applicant: GLOBALFOUNDRIES INC.
Inventor: Mustapha Slamani , Rebecca R. Percy
IPC: H04B17/10 , H04B17/345 , H04L29/08
Abstract: Embodiments of the present disclosure provide a system, method, and program product to test phase noise. The system may include a frequency converter for reducing a frequency of a portion of the output signal to a transformable frequency, a bandpass filter electrically coupled to the frequency converter for filtering the portion of the output signal the transformable frequency using a predetermined bandwidth, and waveform analysis module for receiving the filtered signal. The frequency converter may include a variable electronic oscillator (EO) configured to select one portion of the output signal. The waveform analysis module applies a Fast Fourier Transform (FFT) to each filtered portion of the output signal, and combines them to yield a total FFT for the output signal.
-
2.
公开(公告)号:US10181915B1
公开(公告)日:2019-01-15
申请号:US16006028
申请日:2018-06-12
Applicant: GLOBALFOUNDRIES INC.
Inventor: Mustapha Slamani , Timothy M. Platt , Thomas Moon
Abstract: A local oscillator signal is output from a local oscillator using a reference signal produced by a reference signal generator. Similarly, a test intermediate frequency signal is output from a source oscillator using the reference signal. The test intermediate frequency signal is converted to a test radio frequency signal, with an up-converter using the local oscillator signal. The test radio frequency signal is supplied to a device under test, and an output radio frequency signal is received back from the device under test. The output radio frequency signal is converted to an output intermediate frequency signal, with a down-converter using the local oscillator signal. The output intermediate frequency signal is converted to a digital output signal, with a synchronized digitizer using the reference signal. Different phase signals of the output intermediate frequency signal are captured using the synchronized digitizer as the device under test is operated during a testing cycle.
-