公开(公告)号：US20210374941A1

公开(公告)日：2021-12-02

申请号：US17250263

申请日：2020-08-26

Applicant: GOERTEK INC.

Inventor： Jie LIU ,  Li MA ,  Liang ZHANG

IPC: G06T7/00 ,  G06T7/70 ,  G06K9/62 ,  G06T7/136 ,  G06T7/11 ,  G01N21/88 ,  G06N3/08

Abstract: A product defect detection method, device and system are disclosed. The product defect detection method comprises: constructing a defect detection framework including a classification network, a locating detection network and a judgment network; training the classification network by using a sample image of a product containing different defect types to obtain a classification network capable of classifying the defect types existing in the sample image; training the locating detection network by using a sample image of a product containing different defect types to obtain a locating detection network capable of locating a position of each type of defect in the sample image; inputting an acquired product image into the defect detection framework, inputting a classification result and a detection result obtained into the judgment network to judge whether the product has a defect, and detecting a defect type and a defect position when the product has a defect.