公开(公告)号：US11295435B2

公开(公告)日：2022-04-05

申请号：US17250262

申请日：2020-08-29

Applicant: GOERTEK INC.

Inventor： Jie Liu ,  Jifeng Tian ,  Wenchao Zhang ,  Yifan Zhang

IPC: G06T7/00 ,  G06K9/64 ,  G06K9/62

Abstract: A product defect detection method, device and system are disclosed. The method comprises: constructing a defect detection framework including segmentation networks, a concatenating network and a classification network, and setting a quantity of the segmentation network according to product defect types, wherein each segmentation network corresponds to a defect type; concatenating the sample image with the mask image output by each segmentation network by using the concatenating network to obtain a concatenated image; training the classification network by using the concatenated images to obtain a classification network capable of correctly identifying a product defect and a defect type; and when performing product defect detection, inputting a product image acquired into the defect detection framework, and detecting a product defect and a defect type existing in the product by using the segmentation networks, the concatenating network and the classification network.