公开(公告)号：US20170185123A1

公开(公告)日：2017-06-29

申请号：US15314785

申请日：2014-07-31

Applicant: HEWLETT PACKARD ENTERPRISE DEVELOPMENT LP

Inventor： Raghavan V. VENUGOPAL ,  Patrick A. RAYMOND ,  William C. HALLOWELL ,  Han WANG ,  Chin-Lung CHIANG ,  Jyun-Jie WANG

IPC: G06F1/26 ,  G06F11/20 ,  G06F1/30 ,  G06F11/14

Abstract: A test and diagnostics circuit, methods and systems are described. An example test and diagnostics circuit includes a controller and a power monitor coupled to the controller. A load switch on the test and diagnostics circuit selectably implements a load from among multiple load values to test a computing and/or data storage system. The test and diagnostics circuit includes circuitry connecting the controller, the power monitor and the load switch to receive a test enable signal from a non-dedicated pin in a non-volatile dual inline memory module (NV-DIMM) slot to implement a test operation on the system.