公开(公告)号：US20180059184A1

公开(公告)日：2018-03-01

申请号：US15686740

申请日：2017-08-25

Applicant: HUAWEI TECHNOLOGIES CO., LTD.

Inventor： Huijuan DENG ,  Jin MA ,  Yu Liu ,  Hao WANG

IPC: G01R31/3185 ,  G01R31/317

CPC classification number: G01R31/318597 ,  G01R31/31705 ,  G01R31/31724 ,  G01R31/318561 ,  G01R31/318588

Abstract: The JTAG debug apparatus includes: a TAP controller, configured to communicate with outside by using an external JTAG port, and generate, based on a signal received from the JTAG port, a debug signal including an address of the to-be-debugged unit and a debug instruction, where the debug signal is a JTAG port signal based on the JTAG protocol; a signal conversion unit, configured to receive the debug signal that is output from the TAP controller, and convert the debug signal from the JTAG port signal to a bus slave port signal that can access a slave port of the to-be-debugged unit; and a bus, configured to obtain the debug signal that is converted to the bus slave port signal and that is output from the signal conversion unit, and transmit, based on the debug signal, the debug instruction to the to-be-debugged unit indicated by the address of the to-be-debugged unit.