公开(公告)号：US20060140818A1

公开(公告)日：2006-06-29

申请号：US10545722

申请日：2004-10-19

申请人： Hisashi Sakamoto ,  Takeshi Matsuda ,  Kouji Egawa ,  Tetsuaki Saiji

发明人： Hisashi Sakamoto ,  Takeshi Matsuda ,  Kouji Egawa ,  Tetsuaki Saiji

IPC分类号： G01N31/22

CPC分类号： G01N33/523

摘要： The present invention provides a sample analysis tool that can provide a sufficient amount of information accurately and allows an analyzer to read out the information without using any special mechanism. In a sample analysis tool 1 including a reagent layer 11 and an information recording layer 12 formed on a substrate 13, the information recording layer is composed of one region or divided into a plurality of regions, and each region is colored with a single color. Information is recorded using at least one of a combination of color intensities over the plurality of regions and an area of each region.

摘要翻译： 本发明提供一种能够准确地提供足够数量的信息并允许分析器读出信息而不使用任何特殊机制的样本分析工具。 在包括形成在基板13上的试剂层11和信息记录层12的样本分析工具1中，信息记录层由一个区域或分成多个区域组成，并且每个区域用单一颜色着色。 使用多个区域上的颜色强度的组合和每个区域的区域中的至少一个来记录信息。

公开(公告)号：US20060076523A1

公开(公告)日：2006-04-13

申请号：US10537003

申请日：2003-11-20

申请人： Yukio Higashiisogawa ,  Junichi Oka ,  Tetsuaki Saiji

发明人： Yukio Higashiisogawa ,  Junichi Oka ,  Tetsuaki Saiji

IPC分类号： G01N21/86

CPC分类号： G01N21/55 ,  G01N21/4738 ,  G01N21/8483 ,  G01N2201/08

摘要： The present invention relates to an analyzing device provided with: a light-measuring mechanism (6) that includes a light-emitting unit for emitting light onto a test tool (7) to analyze a sample and a light-receiving unit for receiving reflection light from the test tool (7); and a detecting mechanism (4) for detecting whether or not the test tool exists in a target area, the mechanism including a light-emitting unit for emitting light onto the test tool (7) and a light-receiving unit for receiving reflection light from the test tool (7). In the light-measuring mechanism (6), the light-emitting unit and light-receiving unit are disposed such that the light emission axis of the light-emitting unit and the light reception axis of the light-receiving unit are parallel or substantially parallel to each other. The detecting mechanism (4) is arranged such that the one or more light-receiving units selectively receive regularly-reflected light from the test tool (7) among the light emitted from the light-emitting unit.

摘要翻译： 分析装置技术领域本发明涉及一种分析装置，其具备：光测量机构（6），其包括用于将光发射到测试工具（7）上以分析样本的发光单元和用于接收反射光的光接收单元 从测试工具（7）; 以及用于检测所述测试工具是否存在于目标区域中的检测机构（4），所述机构包括用于将光发射到所述测试工具（7）上的发光单元和用于接收来自所述测试工具（7）的反射光的光接收单元 测试工具（7）。 在该测光机构（6）中，发光单元和受光单元被布置成使得发光单元的发光轴和光接收单元的光接收轴平行或基本平行 对彼此。 检测机构（4）被布置成使得一个或多个光接收单元在从发光单元发射的光中选择性地接收来自测试工具（7）的规则反射光。

公开(公告)号：US07382460B2

公开(公告)日：2008-06-03

申请号：US10537003

申请日：2003-11-20

申请人： Yukio Higashiisogawa ,  Junichi Oka ,  Tetsuaki Saiji

发明人： Yukio Higashiisogawa ,  Junichi Oka ,  Tetsuaki Saiji

IPC分类号： G01N21/55

CPC分类号： G01N21/55 ,  G01N21/4738 ,  G01N21/8483 ,  G01N2201/08

摘要： The present invention relates to an analyzing device provided with: a light-measuring mechanism (6) that includes a light-emitting unit for emitting light onto a test tool (7) to analyze a sample and a light-receiving unit for receiving reflection light from the test tool (7); and a detecting mechanism (4) for detecting whether or not the test tool exists in a target area, the mechanism including a light-emitting unit for emitting light onto the test tool (7) and a light-receiving unit for receiving reflection light from the test tool (7). In the light-measuring mechanism (6), the light-emitting unit and light-receiving unit are disposed such that the light emission axis of the light-emitting unit and the light reception axis of the light-receiving unit are parallel or substantially parallel to each other. The detecting mechanism (4) is arranged such that the one or more light-receiving units selectively receive regularly-reflected light from the test tool (7) among the light emitted from the light-emitting unit.

摘要翻译： 分析装置技术领域本发明涉及一种分析装置，其具备：光测量机构（6），其包括用于将光发射到测试工具（7）上以分析样本的发光单元和用于接收反射光的光接收单元 从测试工具（7）; 以及用于检测所述测试工具是否存在于目标区域中的检测机构（4），所述机构包括用于将光发射到所述测试工具（7）上的发光单元和用于接收来自所述测试工具（7）的反射光的光接收单元 测试工具（7）。 在该测光机构（6）中，发光单元和受光单元被布置成使得发光单元的发光轴和光接收单元的光接收轴平行或基本平行 对彼此。 检测机构（4）被布置成使得一个或多个光接收单元在从发光单元发射的光中选择性地接收来自测试工具（7）的规则反射光。