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公开(公告)号:US12070181B2
公开(公告)日:2024-08-27
申请号:US16671728
申请日:2019-11-01
CPC分类号: A47L9/2826 , G01N21/31 , G01N21/4738 , G05D1/0212 , A47L2201/06
摘要: The invention relates to a floor cleaning appliance which comprises at least one cleaning assembly for cleaning a floor surface and an optical detection device with which a floor type is determinable. In order to provide a floor cleaning appliance with which a reliable determination of the floor type is possible, it is proposed in accordance with the invention that the detection device is configured as or comprises a spectroscopic device with which the floor type is determinable on the basis of a spectrum of the floor surface recorded by reflection measurement. The invention also relates to a method for floor cleaning.
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公开(公告)号:US20240273707A1
公开(公告)日:2024-08-15
申请号:US18563371
申请日:2022-04-07
申请人: Jin Ho KIM
发明人: Jin Ho KIM
CPC分类号: G06T7/001 , G01N21/4738 , G01N21/95 , G06T7/13 , G06T7/50 , G06T7/60 , G06T7/74 , G06T7/90 , G06T2207/10024 , G06T2207/30108
摘要: The present invention provides a high-speed automatic film-foreign substance detection apparatus, including: a stage on which a sample is mounted; a plurality of side light units arranged on an upper side surface of the stage to irradiate side light toward a sample during an operation of a low-magnification optical module; a low-magnification optical module installed at an upper side of the stage and generating a low-magnification image by capturing the sample so that the foreign substance can be detected from the sample using the light scattering of the foreign substance by the side light irradiated from the side light unit; a high-magnification optical module installed at one side of the stage, having a high-magnification driving unit installed and connected thereto to drive in directions of an x-axis, a y-axis and a z-axis, and generating a high-magnification image by capturing the sample; and a user device for controlling the operation of the low-magnification optical module and the high-magnification optical module, and receiving, storing, playing and analyzing the low-magnification image and the high-magnification image.
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3.
公开(公告)号:US20240167948A1
公开(公告)日:2024-05-23
申请号:US18395601
申请日:2023-12-24
申请人: Iraq Kavosh , Raya Kavosh , Roxanne Kavosh
发明人: Iraq Kavosh , Raya Kavosh , Roxanne Kavosh
IPC分类号: G01N21/47
CPC分类号: G01N21/4738 , G01N2201/06113 , G01N2201/0636
摘要: The embodiments disclose a method for in-situ processing and inspection of an object including utilizing a process laser beam source in a process for a probe light beam source for in-situ inspection of an object surface, impinging at least one process laser pulse onto a target surface region, modifying at least one of the optical, mechanical, or chemical properties of a first region of the surface, generating back-reflected scattered laser light and/or laser light reflected in a specular beam off an illuminated spot on the object surface, generating scattered light emitted in a laser-surface interaction, collecting and measuring the generated scattered light and/or laser light reflected in a specular beam off an illuminated spot, and constructing an image of the modified surface wherein the constructed image is used to adjust laser pulse intensities for predetermined modifications to other regions.
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公开(公告)号:US20240164668A1
公开(公告)日:2024-05-23
申请号:US18520380
申请日:2023-11-27
发明人: Kevin Pauley , Cristiano Dalvi , Hung Vo , Jesse Chen , Ferdyan Lesmana , Jeroen Poeze , Sean Merritt
IPC分类号: A61B5/1455 , A61B5/00 , A61B5/145 , G01J1/16 , G01N21/31 , G01N21/47 , G01N21/49 , G01N21/59
CPC分类号: A61B5/14552 , A61B5/14532 , A61B5/14535 , A61B5/14539 , A61B5/14542 , A61B5/14546 , A61B5/4875 , G01J1/1626 , G01N21/31 , G01N21/4738 , G01N21/49 , G01N21/59 , A61B2562/0238 , G01J2001/1636 , G01J2001/1652 , G01N2021/3181
摘要: An optical measurement device includes a light source, a first detector, and a second detector. The light source emits light to a measurement site of a patient and one or more detectors detect the light from the light source. At least a portion of a detector is translucent and the light passes through the translucent portion prior to reaching the measurement site. A detector receives the light after attenuation and/or reflection or refraction by the measurement site. A processor determines a light intensity of the light source, a light intensity through a tissue site, or a light intensity of reflected or refracted light based on light detected by the one or more detectors. The processor can estimate a concentration of an analyte at the measurement site or an absorption or reflection at the measurement site.
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公开(公告)号:US20240087937A1
公开(公告)日:2024-03-14
申请号:US18449020
申请日:2023-08-14
发明人: Naoki Hara , Tomihiro Amano , Shin Hiyama
CPC分类号: H01L21/681 , G01N21/4738 , G01N21/9501 , H01L21/67253 , H01L21/67276
摘要: According to the present disclosure, there is provided a technique capable of suppressing an erroneous detection of a presence or absence of a substrate caused by a light receiver receiving a specularly reflected light. There is provided a technique that includes: a holding structure provided with a placing surface capable of accommodating a substrate thereon; a light detector including: a light emitter arranged to irradiate an irradiation light toward a back surface of the substrate placed on the placing surface; and a light receiver arranged to be capable of receiving a diffusely reflected light of the irradiation light irradiated from the light emitter without receiving a specularly reflected light of the irradiation light; and a controller configured to be capable of determining a presence or absence of the substrate based on a light receiving state of the light receiver.
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公开(公告)号:US11864890B2
公开(公告)日:2024-01-09
申请号:US16985497
申请日:2020-08-05
发明人: Kevin Pauley , Cristiano Dalvi , Hung Vo , Jesse Chen , Ferdyan Lesmana , Jeroen Poeze , Sean Merritt
IPC分类号: A61B5/1455 , A61B5/145 , G01J1/16 , G01N21/47 , G01N21/31 , G01N21/49 , A61B5/00 , G01N21/59
CPC分类号: A61B5/14552 , A61B5/14532 , A61B5/14535 , A61B5/14539 , A61B5/14542 , A61B5/14546 , A61B5/4875 , G01J1/1626 , G01N21/31 , G01N21/4738 , G01N21/49 , G01N21/59 , A61B2562/0238 , G01J2001/1636 , G01J2001/1652 , G01N2021/3181
摘要: An optical measurement device includes a light source, a first detector, and a second detector. The light source emits light to a measurement site of a patient and one or more detectors detect the light from the light source. At least a portion of a detector is translucent and the light passes through the translucent portion prior to reaching the measurement site. A detector receives the light after attenuation and/or reflection or refraction by the measurement site. A processor determines a light intensity of the light source, a light intensity through a tissue site, or a light intensity of reflected or refracted light based on light detected by the one or more detectors. The processor can estimate a concentration of an analyte at the measurement site or an absorption or reflection at the measurement site.
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公开(公告)号:US20230366815A1
公开(公告)日:2023-11-16
申请号:US18021885
申请日:2021-07-20
发明人: Jeroen COTTAAR
CPC分类号: G01N21/4738 , G01N21/9501
摘要: Disclosed is a method for performing a measurement of an exposed pattern in photoresist on a substrate and an associated metrology device. The method comprises imparting a beam of measurement radiation on said exposed pattern over a measurement area of a size which prevents or mitigates photoresist damage from the measurement radiation; capturing scattered radiation comprising said measurement radiation subsequent to it having been scattered from said exposed pattern and detecting the scattered radiation on at least one detector. A value for a parameter of interest is determined from the scattered radiation.
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公开(公告)号:US20230293087A1
公开(公告)日:2023-09-21
申请号:US18008128
申请日:2021-06-15
申请人: Shilpa MALIK , Anupam LAVANIA
发明人: Shilpa MALIK , Anupam LAVANIA
CPC分类号: A61B5/4064 , A61B5/7264 , G01N21/4738 , A61B2560/0223 , A61B2560/0431
摘要: Present disclosure describes the method and system for detecting the brain condition state of a subject. Method comprising calibrating a power zone of the system in real-time and detecting a reflected signal for each of a plurality of transmitted input signals on scanning each of lobe locations of the subject after calibration. Thereafter, method comprising validating an array generated using the plurality of transmitted input signal and corresponding reflected signal for each of the lobe locations and generating a lobe fit value for the validated array using a curve fitting technique. Subsequently, method comprising computing logarithmic ratios corresponding to four pairs of contralateral lobe location, six pairs of ipsilateral lobe locations in left hemisphere and six pairs of ipsilateral lobe locations in right hemisphere using the lobe fit value and classifying the logarithmic ratios into one of brain condition state classes by comparing with pre-labelled logarithmic ratios stored in system.
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公开(公告)号:US20230258577A1
公开(公告)日:2023-08-17
申请号:US18153036
申请日:2023-01-11
发明人: Shigeru Oba
CPC分类号: G01N21/9503 , G01N21/4738 , H01L22/12 , G01N2021/4783 , G01N2201/101 , G01N2201/103
摘要: An edge portion measuring apparatus for measuring shape of an edge portion of a wafer, including, a holding portion that holds the wafer, a rotating means for rotating the wafer, a sensor including a light projecting portion for projecting a laser light from a light source onto the edge portion of the wafer held by the holding portion, and a light receiving detection unit receiving diffuse reflected light that the laser light projected is reflected at the edge portion of the wafer, wherein, rotating the wafer while holding the wafer, at least in a range from normal direction of a held surface of the wafer to normal direction of a surface opposite to the held surface, projecting the laser light and detecting the diffuse reflected light by the sensor, being able to measure the shape of an entire area of the edge portion of the wafer by a triangulation method.
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公开(公告)号:US11680908B2
公开(公告)日:2023-06-20
申请号:US16839689
申请日:2020-04-03
申请人: CORNING INCORPORATED
CPC分类号: G01N21/7703 , G01N21/17 , G01N21/4738 , G01N21/64 , G01N21/648 , G01N2021/4766 , G01N2021/7726 , G01N2021/7786
摘要: A waveguide sensor system is provided. The system includes a light source and a waveguide formed from a light transmitting material. Light from the light source enters the waveguide at an input area and travels within the waveguide by total internal reflection to an analyte area and light to be analyzed travels within the waveguide from the analyte area by total internal reflection to an output area. An optical sensor is coupled to the output area and is configured to interact with the light to be analyzed. The system includes a plurality of pores located along the outer surface within the analyte area and formed in the light transmitting material of the waveguide, and the pores are configured to enhance light interaction with the analyte within the analyte area. The pores and analyte area may be protected and/or enhanced with a hydrophobic layer overlaying the pores.
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