公开(公告)号：US3628144A

公开(公告)日：1971-12-14

申请号：US3628144D

申请日：1969-01-15

Applicant: IBM

Inventor： ARONSTEIN JESSE ,  GUNTHERT RICHARD J

IPC: B24B53/00 ,  G01B5/06 ,  G01B11/06 ,  G01R1/067 ,  G01R1/073 ,  H01H1/60 ,  H01L21/50 ,  H01L21/66 ,  G01R31/00 ,  B24B19/00 ,  H01H9/00

CPC classification number: G01B5/066 ,  G01B11/0683 ,  G01R1/06705 ,  G01R1/07342

Abstract: Electric contacts, which are utilized in testing semiconductor chips or the like, become contaminated by deposits left on the contacts by the chips during testing. These contaminants are removed by cleaning means movable by the chip handling equipment. After the contacts have been cleaned, the debris is removed by an air jet.

公开(公告)号：US3609539A

公开(公告)日：1971-09-28

申请号：US3609539D

申请日：1968-09-28

Applicant: IBM

Inventor： GUNTHERT RICHARD J

IPC: G01R1/067 ,  G01R1/073 ,  H01H1/32 ,  G01R31/02

CPC classification number: H01H1/32 ,  G01R1/06738 ,  G01R1/07342 ,  G01R27/02

Abstract: Electrical contact device for Kelvin probing comprising two contact bars separated by an insulator, said bars having selfaligning shaped contact ends for self-aligning upon a protruding electrical contact on the body to be probed.