公开(公告)号：US20190042142A1

公开(公告)日：2019-02-07

申请号：US15857954

申请日：2017-12-29

Applicant: Intel Corporation

Inventor： Jason Casmira ,  Jawad Khan ,  Ambika Krishnamoorthy ,  Sanjeev Trika

IPC: G06F3/06 ,  G06F11/34 ,  G06F11/30

Abstract: An embodiment of a semiconductor apparatus may include technology to monitor one or more external performance indicators related to a workload impact on a persistent storage media, monitor one or more internal performance indicators for the persistent storage media, and adjust the workload based on the external performance indicators, the internal performance indicators, and priority information related to the workload. Other embodiments are disclosed and claimed.

公开(公告)号：US20190042352A1

公开(公告)日：2019-02-07

申请号：US16012294

申请日：2018-06-19

Applicant: Intel Corporation

Inventor： Jason Casmira ,  Jawad Khan ,  Ambika Krishnamoorthy ,  Adrian Pearson

IPC: G06F11/07 ,  H04L9/08

Abstract: Systems, apparatuses and methods may provide for technology to conduct, by a storage device, a state analysis of the storage device based on an assert log associated with a failure condition in the storage device. The technology may also return, by the storage device, the storage device to service if the state analysis indicates that the storage device is operable. Additionally, the technology may remove, by the storage device, the storage device from service if the state analysis indicates that the storage device is inoperable.