公开(公告)号：US20170254683A1

公开(公告)日：2017-09-07

申请号：US15061535

申请日：2016-03-04

Applicant: Intel Corporation

Inventor： Yael Yanai ,  Yehiel Shilo ,  Eli Kupermann ,  Chen-Hsun Wu ,  Elena Agranovsky ,  Marlon D. Bada

IPC: G01D18/00

Abstract: Embodiments of the present disclosure provide techniques for sensor testing for computing devices during initial movement of the device, such as movement on a manufacturing line. In one instance, a device with integral sensor testing during initial movement of the device may include a plurality of sensors and a sensor test block coupled with the plurality of sensors, to detect, collect and/or report readings provided by at least some of the sensors in response to movement of the device between at least a first test station and a second test station. Other embodiments may be described and/or claimed.

公开(公告)号：US10677618B2

公开(公告)日：2020-06-09

申请号：US15061535

申请日：2016-03-04

Applicant: Intel Corporation

Inventor： Yael Yanai ,  Yehiel Shilo ,  Eli Kupermann ,  Chen-Hsun Wu ,  Elena Agranovsky ,  Marlon D. Bada

IPC: G01D18/00

Abstract: Embodiments of the present disclosure provide techniques for sensor testing for computing devices during initial movement of the device, such as movement on a manufacturing line. In one instance, a device with integral sensor testing during initial movement of the device may include a plurality of sensors and a sensor test block coupled with the plurality of sensors, to detect, collect and/or report readings provided by at least some of the sensors in response to movement of the device between at least a first test station and a second test station. Other embodiments may be described and/or claimed.