TESTING OF DEVICE SENSORS ON A MANUFACTURING LINE

    公开(公告)号:US20170254683A1

    公开(公告)日:2017-09-07

    申请号:US15061535

    申请日:2016-03-04

    Abstract: Embodiments of the present disclosure provide techniques for sensor testing for computing devices during initial movement of the device, such as movement on a manufacturing line. In one instance, a device with integral sensor testing during initial movement of the device may include a plurality of sensors and a sensor test block coupled with the plurality of sensors, to detect, collect and/or report readings provided by at least some of the sensors in response to movement of the device between at least a first test station and a second test station. Other embodiments may be described and/or claimed.

    Sensor signal reconstruction in a sensor hub

    公开(公告)号:US10912494B2

    公开(公告)日:2021-02-09

    申请号:US15780226

    申请日:2016-08-10

    Abstract: A sensor interface circuit enables signal reconstruction on data received from a sensor prior to sending the data to various sensor clients. Multiple sensor clients have different frequencies configured to receive sensor data. The sensor interface circuit performs signal reconstructions including data interpolation to generate interpolated data signal having frequencies corresponding to the different frequencies configured for the different sensor clients. Signal reconstruction can also include filtering the data. The sensor interface circuit sends the reconstructed data to the multiple clients in accordance with their different frequencies.

    Offline sensor calibration
    4.
    发明授权

    公开(公告)号:US11112283B2

    公开(公告)日:2021-09-07

    申请号:US15768745

    申请日:2015-12-21

    Abstract: Systems, apparatuses and methods may provide for detecting one or more trigger condition on a mobile platform and activating an offline calibration of one or more sensors on the mobile platform in response to the one or more trigger conditions. Additionally, an operational profile of the one or more sensors may be updated based on the offline condition. In one example, the trigger conditions include one or more of a time condition, a temperature condition, a motion condition or a system event condition.

    Testing of device sensors on a manufacturing line

    公开(公告)号:US10677618B2

    公开(公告)日:2020-06-09

    申请号:US15061535

    申请日:2016-03-04

    Abstract: Embodiments of the present disclosure provide techniques for sensor testing for computing devices during initial movement of the device, such as movement on a manufacturing line. In one instance, a device with integral sensor testing during initial movement of the device may include a plurality of sensors and a sensor test block coupled with the plurality of sensors, to detect, collect and/or report readings provided by at least some of the sensors in response to movement of the device between at least a first test station and a second test station. Other embodiments may be described and/or claimed.

    OFFLINE SENSOR CALIBRATION
    6.
    发明申请

    公开(公告)号:US20180299302A1

    公开(公告)日:2018-10-18

    申请号:US15768745

    申请日:2015-12-21

    Abstract: Systems, apparatuses and methods may provide for detecting one or more trigger condition on a mobile platform and activating an offline calibration of one or more sensors on the mobile platform in response to the one or more trigger conditions. Additionally, an operational profile of the one or more sensors may be updated based on the offline condition. In one example, the trigger conditions include one or more of a time condition, a temperature condition, a motion condition or a system event condition.

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