ON-CHIP PHASE NOISE MEASUREMENT SYSTEM FOR BUILD-IN SELF-TEST OF MULTIPLE HIGH-FREQUENCY OSCILLATOR SYSTEMS

    公开(公告)号:US20240385307A1

    公开(公告)日:2024-11-21

    申请号:US18318754

    申请日:2023-05-17

    Abstract: A non-transitory computer readable medium having instructions stored therein that when executed by a processor cause the processor to: determine a time difference between a first reference point of a first signal and a second reference point of a second signal, the first signal modulated with a first frequency, and the second signal modulated with a second frequency different from the first frequency; to determine a phase noise based on the determined time difference; and to use the determined phase noise for processing a signal associated with the first signal.

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