公开(公告)号：US10516790B2

公开(公告)日：2019-12-24

申请号：US16201675

申请日：2018-11-27

申请人： KONICA MINOLTA, INC.

发明人： Kenji Yamanaka ,  Makoto Oki

IPC分类号： H04N1/00 ,  G03G15/00

摘要： There is provided an inspection apparatus that inspects a printed material for a smudge, in accordance with an inspection image formed by reading a printed material, a print image being formed on the printed material, the inspection apparatus including: a hardware processor that: performs position adjustment between a reference image serving as an inspection standard for the print image, and the inspection image; detects a region presumed to be a smudge on the printed material as a smudge candidate region, in accordance with a difference image generated from the reference image and the inspection image after the position adjustment; and determines whether the smudge candidate region is a false smudge candidate region resulting from a positional shift of an object in the print image, in accordance with the smudge candidate region detected by the hardware processor and difference data characteristics of the difference image.