公开(公告)号：US06985219B2

公开(公告)日：2006-01-10

申请号：US09746618

申请日：2000-12-21

Applicant: Kenneth R. Wilsher ,  Steven A Kasapi

Inventor： Kenneth R. Wilsher ,  Steven A Kasapi

IPC: G01N21/88

CPC classification number: G01R31/311 ,  G01R31/31905

Abstract: A method and system of testing integrated circuits (IC) via optical coupling. The optical system includes an optical fiber, fixture and focussing element. In addition, channels are provided in the fixture mounted on the integrated circuit to accommodate the optical system. The fixture acts as a heat sink. As such, one or more photosensitive elements/targets on the integrated circuit are probed using light that is brought to a focus on each target site. The light causes latching of data into the integrated circuit (which is operating under influence of a test program) and formation of a test pattern output from the integrated circuit that is used to confirm proper functioning of the IC.