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14 条记录 (耗时 0.017 秒)

    On-chip optically triggered latch for IC time measurements
    2.
    发明授权
    On-chip optically triggered latch for IC time measurements 失效
    用于IC时间测量的片上光触发锁存器

    公开(公告)号：US06501288B1

    公开(公告)日：2002-12-31

    申请号：US09675090

    申请日：2000-09-28

    申请人： Kenneth R. Wilsher

    发明人： Kenneth R. Wilsher

    IPC分类号： G01R31308

    CPC分类号： G01R31/311 ,  G01R31/318538 ,  G01R31/318572

    摘要： Method and on chip circuitry for testing integrated circuits, for instance, flip chip integrated circuits. Provided on the integrated circuit in addition to the conventional circuitry is additional circuitry including a photosensitive element such as a photodiode, the output terminal of which is connected via a Schmidt trigger to the clock terminal of an on-chip flip-flop. The node of the integrated circuit to be tested, for instance, the output terminal of a logic gate, is connected to the D input terminal of the same flip-flop. Hence, light incident on the photosensitive element clocks the flip-flop, allowing sampling of the state of the output signal from the logic gate. Advantageously, the photodiode need not be a specially made structure but in one version is the conventional PN junction provided by, e.g., the drain of a standard CMOS transistor.

    摘要翻译： 用于测试集成电路的方法和片上电路，例如倒装芯片集成电路。 除了常规电路之外，在集成电路上提供的附加电路包括诸如光电二极管的光敏元件，其输出端通过施密特触发器连接到片上触发器的时钟端子。 要测试的集成电路的节点，例如逻辑门的输出端连接到同一个触发器的D输入端。 因此，入射到感光元件上的光对触发器进行计时，从而可以对来自逻辑门​​的输出信号的状态进行采样。 有利地，光电二极管不需要是特别制造的结构，而是在一个版本中是由例如标准CMOS晶体管的漏极提供的常规PN结。

    Optical coupling for testing integrated circuits
    3.
    发明授权
    Optical coupling for testing integrated circuits 有权
    用于测试集成电路的光耦合器

    公开(公告)号：US07042563B2

    公开(公告)日：2006-05-09

    申请号：US11042288

    申请日：2005-01-24

    申请人： Kenneth R. Wilsher ,  Steven Kasapi

    发明人： Kenneth R. Wilsher ,  Steven Kasapi

    IPC分类号： G01N21/88

    CPC分类号： G01R31/311 ,  G01R31/31905

    摘要： A method and system of testing integrated circuits (IC) via optical coupling. The optical system includes an optical fiber, fixture and focusing element. In addition, channels are provided in the fixture mounted on the integrated circuit to accommodate the optical system. The fixture acts as a heat sink. As such, one or more photosensitive elements/targets on the integrated circuit are probed using light that is brought to a focus on each target site. The light causes latching of data into the integrated circuit (which is operating under influence of a test program) and formation of a test pattern output from the integrated circuit that is used to confirm proper functioning of the IC.

    摘要翻译： 一种通过光耦合测试集成电路（IC）的方法和系统。 光学系统包括光纤，夹具和聚焦元件。 此外，在安装在集成电路上的灯具中提供通道以容纳光学系统。 夹具用作散热器。 因此，使用聚焦在每个目标位置的光来探测集成电路上的一个或多个感光元件/靶。 光引起数据锁存到集成电路中（其在测试程序的影响下运行），并形成用于确认IC正常工作的集成电路输出的测试图案。

    PICA system timing measurement and calibration
    4.
    发明授权
    PICA system timing measurement and calibration 有权
    PICA系统时序测量和校准

    公开(公告)号：US07228464B2

    公开(公告)日：2007-06-05

    申请号：US10974464

    申请日：2004-10-26

    申请人： Kenneth R. Wilsher

    发明人： Kenneth R. Wilsher

    IPC分类号： G11B20/20 ,  G04F10/00 ,  G01R35/00

    CPC分类号： G01R35/005 ,  G01R31/311

    摘要： PICA probe system apparatus is described, including apparatus for calibrating an event timer having a coarse measurement capability in which time intervals defined by clock boundaries are counted and a fine measurement capability in which time between boundaries is interpolated using a voltage ramp.

    摘要翻译： 描述了PICA探针系统装置，其包括用于校准具有粗略测量能力的事件定时器的装置，其中对由时钟边界定义的时间间隔进行计数，以及使用电压斜坡内插边界之间的精细测量能力。

    Spatial and temporal selective laser assisted fault localization
    6.
    发明授权
    Spatial and temporal selective laser assisted fault localization 有权
    空间和时间选择性激光辅助故障定位

    公开(公告)号：US06967491B2

    公开(公告)日：2005-11-22

    申请号：US10888840

    申请日：2004-07-09

    申请人： Philippe Perdu ,  Romain Desplats ,  Felix Beaudoin ,  Praveen Vedagarbha ,  Martin Leibowitz ,  Kenneth R. Wilsher

    发明人： Philippe Perdu ,  Romain Desplats ,  Felix Beaudoin ,  Praveen Vedagarbha ,  Martin Leibowitz ,  Kenneth R. Wilsher

    IPC分类号： G01R31/26 ,  G01R31/302 ,  G01R31/311 ,  G03C5/00 ,  G06F17/50 ,  G21K5/10 ,  H01J37/08 ,  H01S20060101

    CPC分类号： G01R31/31816 ,  G01R31/311

    摘要： A method and apparatus for laser-assisted fault mapping which synchronizes the laser control with the tester unit. The inventive method provides for laser-assisted pseudo-static fault mapping to localize defects in a device whose inputs are being stimulated dynamically by a tester. It further provides for laser-assisted dynamic soft error mapping, to localize in terms of location and to correlate with respect to a specific test vector, sensitive areas in a device by utilizing device performance criteria such as pass-fail status outputs. The apparatus includes a fully controllable dynamic laser stimulation apparatus connected to a control unit that provides complete synchronization with a tester unit.

    摘要翻译： 一种用于激光辅助故障映射的方法和装置，其将激光控制与测试器单元同步。 本发明的方法提供了激光辅助伪静态故障映射以定位其输入被测试仪动态地刺激的设备中的缺陷。 它进一步提供激光辅助动态软误差映射，通过利用诸如通过失败状态输出的设备性能标准来定位位置方面并且相对于特定测试矢量，设备中的敏感区域相关。 该装置包括连接到与测试器单元完全同步的控制单元的完全可控的动态激光刺激装置。

    PICA system timing measurement & calibration
    7.
    发明授权
    PICA system timing measurement & calibration 有权
    PICA系统时序测量和校准

    公开(公告)号：US06819117B2

    公开(公告)日：2004-11-16

    申请号：US10066123

    申请日：2002-01-30

    申请人： Kenneth R. Wilsher

    发明人： Kenneth R. Wilsher

    IPC分类号： G01R3500

    CPC分类号： G01R35/005 ,  G01R31/311

    摘要： PICA probe system methods and apparatus are described, including methods and apparatus for calibrating an event timer having a coarse measurement capability in which time intervals defined by clock boundaries are counted and a fine measurement capability in which time between boundaries is interpolated using a voltage ramp.

    摘要翻译： 描述了PICA探针系统方法和装置，包括用于校准具有粗略测量能力的事件定时器的方法和装置，其中对由时钟边界定义的时间间隔进行计数，并且使用电压斜坡插入边界之间的时间的精细测量能力。

    Photoconductive-sampling voltage measurement
    8.
    发明授权
    Photoconductive-sampling voltage measurement 有权
    光电导采样电压测量

    公开(公告)号：US06737853B2

    公开(公告)日：2004-05-18

    申请号：US10004018

    申请日：2001-10-18

    申请人： Kenneth R. Wilsher ,  Francis Ho

    发明人： Kenneth R. Wilsher ,  Francis Ho

    IPC分类号： G01R3100

    CPC分类号： G01R19/00 ,  G01R13/347

    摘要： A method of probing voltage comprises: establishing electrical connectivity between a conductor to be probed and a first terminal of a photoconductive switch; during a sampling interval n, applying a laser pulse to the photoconductive switch while applying a voltage to a second terminal of the photoconductive switch corresponding to a voltage sample taken during a prior sampling interval n−1, such that current flow through the photoconductive switch is dependent on any difference between voltage of the conductor and the applied voltage; converting the current flow to a voltage signal; passing the voltage signal during a gating interval and sampling the passed voltage signal to produce a voltage sample for the sampling interval n. A repetitive test pattern applied to the conductor and the sampling interval is synchronized with the repetitive test pattern. Converting the current flow to a voltage signal can comprise applying the current flow to a current-to-voltage converter having a rise time which is less than the gating interval. The voltage signal can be passed only during the gating interval so that the voltage sample is insensitive to any leakage through the photoconductive switch outside of the gating interval. Passing the voltage signal during a gating interval can comprise applying the voltage signal to a first transistor Q1 of a differential pair of transistors Q1, Q2, applying a reference voltage to a second transistor Q2 of the differential pair of transistors, and controlling common emitter current of the differential pair of transistors with an electronic switch so as to pass the voltage signal when the electronic switch is closed. Sampling the voltage signal can comprises applying the voltage signal to an analog-to-digital converter and enabling the analog-to-digital converter to prepare a digital sample of the voltage signal representing voltage on the conductor. Apparatus for carrying out the method is also provided.

    摘要翻译： 一种探测电压的方法包括：建立要探测的导体与光电导开关的第一端之间的电连接; 在采样间隔n期间，在对应于在先前采样间隔n-1期间采集的电压样本的光电导开关的第二端施加电压，向激光脉冲施加激光脉冲，使得通过光电导开关的电流为 取决于导体的电压和施加的电压之间的任何差异; 将电流转换成电压信号; 在选通间隔期间通过电压信号，并对通过的电压信号进行采样，以产生采样间隔n的电压采样。 应用于导体和采样间隔的重复测试图案与重复测试图案同步。 将电流转换为电压信号可以包括将电流施加到具有小于门控间隔的上升时间的电流 - 电压转换器。 电压信号只能在选通间隔期间通过，因此电压采样对通过栅极间隔外的光导开关的任何泄漏不敏感。 在门控间隔期间通过电压信号可以包括将电压信号施加到晶体管Q1，Q2的差分对的第一晶体管Q1，将参考电压施加到差分晶体管对的第二晶体管Q2，并控制公共发射极电流 具有电子开关的差分对晶体管，以便当电子开关闭合时通过电压信号。 对电压信号进行采样可以包括将电压信号施加到模数转换器并且使得模数转换器能够准备表示导体上的电压的电压信号的数字样本。 还提供了用于执行该方法的装置。

    Method and circuit for controlling voltage reflections on transmission lines
    9.
    发明授权
    Method and circuit for controlling voltage reflections on transmission lines 失效
    用于控制传输线上的电压反射的方法和电路

    公开(公告)号：US5287022A

    公开(公告)日：1994-02-15

    申请号：US37507

    申请日：1993-03-24

    申请人： Kenneth R. Wilsher

    发明人： Kenneth R. Wilsher

    IPC分类号： G01R31/28 ,  G01R31/319 ,  H03K5/08 ,  H03K19/0175 ,  H04L25/02 ,  H03F1/26

    CPC分类号： H04L25/0298 ,  G01R31/31924 ,  H03K5/08

    摘要： The invention is a termination circuit which may be used to terminate a tester end of a transmission line between the tester and a digital device under test (DUT). The termination circuit is a clamp circuit which acts as a non-linear resistor of infinite resistance for termination voltages between zero volts (or low logic level voltage) and the power supply voltage V.sub.cc (or high logic level voltage) of the DUT, and which provides a substantially constant slope resistance set to equal the characteristic impedance (Z.sub.O) of the transmission line for voltages outside this range. Given that the output impedance of the DUT is less than the characteristic impedance Z.sub.O of a transmission line, and given the characteristics of the clamp circuit, all reflections on the transmission line as a result of unmatched impedances are totally eliminated by the clamp in twice the delay time of the transmission line. After the reflections are eliminated, the clamp acts as an open circuit. This clamp circuit may be used in virtually any application where reflections are a concern.

    摘要翻译： 本发明是一种终端电路，其可以用于终止测试仪和被测数字设备（DUT）之间的传输线的测试器端。 终端电路是用作零电压（或低逻辑电平电压）和DUT的电源电压Vcc（或高逻辑电平电压）之间的终端电压的无限电阻的非线性电阻器的钳位电路，其中 提供基本恒定的斜率电阻，设定为等于该范围之外的电压的传输线的特性阻抗（ZO）。 假设DUT的输出阻抗小于传输线的特性阻抗ZO，并给出钳位电路的特性，由于无阻碍的阻抗，传输线上的所有反射完全被钳位在两倍 传输线的延迟时间。 在消除了反射之后，夹具充当开路。 实际上，这种钳位电路可以用于需要考虑反射的任何应用中。

    Pulsed laser photoemission electron-beam probe
    10.
    发明授权
    Pulsed laser photoemission electron-beam probe 失效
    脉冲激光发射电子束探针

    公开(公告)号：US5270643A

    公开(公告)日：1993-12-14

    申请号：US928919

    申请日：1992-08-12

    申请人： Neil Richardson ,  Kenneth R. Wilsher

    发明人： Neil Richardson ,  Kenneth R. Wilsher

    IPC分类号： G01R31/305 ,  G01R31/319 ,  G01R27/26

    CPC分类号： G01R31/31922 ,  G01R31/305

    摘要： An electron-beam test probe system (400) in which a pulsed laser-beam source (404) and a photocathode assembly (430) are used with an electron-beam column (426) to produce a pulsed electron beam at a stabilized repetition frequency. A pulse picker (414) allows the pulse repetition frequency of the pulsed electron beam to be reduced to a submultiple of the pulsed laser repetition frequency. A test pattern generator (416) is programmable to apply a desired pattern of test vector patterns to an electronic circuit to be probed, the test vector patterns being synchronized with the stabilized laser-beam pulse repetition frequency. A timebase circuit (412) allows the test vector patterns to be time-shifted relative to the pulsed electron beam. The electronic circuit under test can thus be probed at any desired point in the applied test vector pattern by control of the pulse picker and by time-shifting the test vector pattern.

    摘要翻译： 电子束测试探针系统（400），其中脉冲激光束源（404）和光电阴极组件（430）与电子束柱（426）一起使用以产生稳定的重复频率的脉冲电子束 。 脉冲选择器（414）允许将脉冲电子束的脉冲重复频率减小到脉冲激光重复频率的一个微分。 测试图形生成器（416）可编程为将要测试矢量图案的期望图案应用于要探测的电子电路，测试矢量图案与稳定的激光束脉冲重复频率同步。 时基电路（412）允许测试矢量图相对于脉冲电子束被时移。 因此，可以通过控制脉冲拾取器和通过时移移动测试矢量图案，在被测试矢量模式中的任何所需点探测被测电子电路。