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公开(公告)号:US4875780A
公开(公告)日:1989-10-24
申请号:US160194
申请日:1988-02-25
IPC分类号: G03F1/00 , G01N21/88 , G01N21/94 , G01N21/956 , G03F1/08 , G03F1/14 , H01L21/027 , H01L21/30 , H01L21/66
CPC分类号: G01N21/94 , G01N2021/95676 , G01N21/95607
摘要: A laser light inspection device for inspecting opposite surfaces of a workpiece with a low angle laser light beam. The laser light beam is directed in successive scans of a first and second sides in a repetitive manner using a pair of dividing mirrors and a pair of low angle mirrors. Light reflected by any debris back toward the direction of origin of the light beam is collected and analyzed.