公开(公告)号：US3599288A

公开(公告)日：1971-08-17

申请号：US3599288D

申请日：1969-01-23

Applicant: LAB FOR ELECTRONICS INC

Inventor： EAKMAN STEPHEN L

IPC: B21B37/28 ,  B29C43/24 ,  B29D7/14

CPC classification number: B21B37/28 ,  B29C43/245

Abstract: A process control system for controlling the adjustments in spacing between calender rolls to adjust the thickness of a process material sheet. A sensing head is scanned transversely across the material sheet producing a profile scan of the thickness of the material and this signal is used to compute the average deviation of thickness from a target value for three transverse zones, the left edge, the center, and the right edge. At the completion of a scan the relative values of these three signals are compared to one another and control signals for both edge corrections and crown correction are developed which take into consideration the interaction between adjustments at each edge and in the center. Each correction is undertaken only with a full set of values across the width of the strip.