Display defect detection system and detection method thereof

    公开(公告)号:US12223638B2

    公开(公告)日:2025-02-11

    申请号:US17891714

    申请日:2022-08-19

    Abstract: A display defect detection system and a detection method thereof are disclosed. A display defect detection system includes a preprocessing circuit receiving a capture image of a test pattern, displayed by a display panel, as a panel image including diagonal Mura and preprocessing the panel image to output a preprocessing image and a Mura detection circuit calculating a final feature value of the diagonal Mura by multiplying a first feature value, in which a luminance difference of the diagonal Mura is reflected, by a second feature value in which a shape ratio of the diagonal Mura is reflected, on the basis of an edge map of the preprocessing image, and detecting a display position of the diagonal Mura on the basis of the final feature value of the diagonal Mura.

Patent Agency Ranking