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公开(公告)号:US11935443B2
公开(公告)日:2024-03-19
申请号:US17895701
申请日:2022-08-25
Applicant: LG Display Co., Ltd.
Inventor: Yeong Yu , Jong Ju Hong
CPC classification number: G09G3/006 , G06V10/25 , G09G2320/0626 , G09G2340/0407
Abstract: A display defect detection circuit of a display defect detection system includes a preprocessing circuit configured to receive a capture image of a test pattern, displayed by a display panel, as a panel image including target Mura having a repetitive characteristic and preprocess the panel image to output a preprocessing image and a Mura detection circuit configured to decrease a total size of the preprocessing image on the basis of a size of the target Mura to generate a resize image, detect an edge component in the resize image to generate an edge map image having feature values, remove a feature value of a non-repetitive type among the feature values of the edge map image to generate a feature map image, and detect a display position of the target Mura on the basis of a final feature value of the target Mura calculated based on the feature map image.
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公开(公告)号:US12223638B2
公开(公告)日:2025-02-11
申请号:US17891714
申请日:2022-08-19
Applicant: LG Display Co., Ltd.
Inventor: Ki Hyun Kim , Jong Ju Hong
Abstract: A display defect detection system and a detection method thereof are disclosed. A display defect detection system includes a preprocessing circuit receiving a capture image of a test pattern, displayed by a display panel, as a panel image including diagonal Mura and preprocessing the panel image to output a preprocessing image and a Mura detection circuit calculating a final feature value of the diagonal Mura by multiplying a first feature value, in which a luminance difference of the diagonal Mura is reflected, by a second feature value in which a shape ratio of the diagonal Mura is reflected, on the basis of an edge map of the preprocessing image, and detecting a display position of the diagonal Mura on the basis of the final feature value of the diagonal Mura.
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