Display defect detection system and detection method thereof

    公开(公告)号:US11935443B2

    公开(公告)日:2024-03-19

    申请号:US17895701

    申请日:2022-08-25

    CPC classification number: G09G3/006 G06V10/25 G09G2320/0626 G09G2340/0407

    Abstract: A display defect detection circuit of a display defect detection system includes a preprocessing circuit configured to receive a capture image of a test pattern, displayed by a display panel, as a panel image including target Mura having a repetitive characteristic and preprocess the panel image to output a preprocessing image and a Mura detection circuit configured to decrease a total size of the preprocessing image on the basis of a size of the target Mura to generate a resize image, detect an edge component in the resize image to generate an edge map image having feature values, remove a feature value of a non-repetitive type among the feature values of the edge map image to generate a feature map image, and detect a display position of the target Mura on the basis of a final feature value of the target Mura calculated based on the feature map image.

    Display defect detection system and detection method thereof

    公开(公告)号:US12223638B2

    公开(公告)日:2025-02-11

    申请号:US17891714

    申请日:2022-08-19

    Abstract: A display defect detection system and a detection method thereof are disclosed. A display defect detection system includes a preprocessing circuit receiving a capture image of a test pattern, displayed by a display panel, as a panel image including diagonal Mura and preprocessing the panel image to output a preprocessing image and a Mura detection circuit calculating a final feature value of the diagonal Mura by multiplying a first feature value, in which a luminance difference of the diagonal Mura is reflected, by a second feature value in which a shape ratio of the diagonal Mura is reflected, on the basis of an edge map of the preprocessing image, and detecting a display position of the diagonal Mura on the basis of the final feature value of the diagonal Mura.

Patent Agency Ranking