公开(公告)号：US20030215131A1

公开(公告)日：2003-11-20

申请号：US10331721

申请日：2002-12-31

Applicant: LG.Philips LCD Co., Ltd.

Inventor： Don Gyou Lee ,  Jung Ho Kil ,  Ki Yeon Song ,  Moon Chul Jeong

IPC: G06K009/00

CPC classification number: G06T7/0004 ,  G06T7/0002 ,  G06T7/48 ,  G06T7/90

Abstract: An image quality analysis method and an image quality analysis system for a display device are provided. The image quality analysis method for a display device includes the steps of outputting an image pattern for analysis of an image quality of the display device, dividing a screen display region to which the image pattern is output into a plurality of sub-regions, producing measurement data representing the image quality with respect to each of the plurality of sub-regions, arranging the produced measurement data as a time series, obtaining a fractal dimension exponent from the data as a time series, and evaluating the fractal dimension exponent as a level of uniformity of the image quality of the display device.

Abstract translation: 提供了用于显示装置的图像质量分析方法和图像质量分析系统。 用于显示装置的图像质量分析方法包括以下步骤：输出用于分析显示装置的图像质量的图像图案，将输出图像图案的屏幕显示区域划分为多个子区域，产生测量 表示相对于所述多个子区域中的每个子区域的图像质量的数据，将所生成的测量数据作为时间序列排列，从所述数据中获取作为时间序列的分形维数指数，并且将所述分形维数指数评估为 显示装置的图像质量的均匀性。